Calibration Specimen, 2-dimensional, 297nm Nominal Period, Aluminum Bumps on Si
Calibration specimen, 2-dimensional, 297 nm nominal period (refer to certificate for actual period), Aluminum bumps on Si Substrate:
Silicon about 4x3 mm
Default mounting: O
n 12 or 15 mm diameter steel disk. Available unmounted on request Available mounted on SEM stub (300-2D-SEM)
Default mounting: on pin stub type A using colloidal graphite paint.
Colloidal silver paint or adhesive carbon tab available on request.
Carbon tab not recommended for pitch < 500 nm.
See mount descriptions
. Available as miniature version with die size about 0.9x0.9 mm (300-2D-Mini).
Sold unmounted only. Recommended for applications where low mass and/or small size are advantageous.