Miniature version, die size 0.9x0.9mm, unmounted only
Mounted on SEM stub
Volume Discount on larger packaging sizes
By simply buying larger package sizes of Advanced Surface Microscopy, Inc. AFM probes, you automatically get a built-in quantity discount compared to the smallest packaging size.
Calibration Specimen, 2-dimensional, 297nm Nominal Period, Aluminum Bumps on Si
300-2D Calibration specimen, 2-dimensional, 297 nm nominal period (refer to certificate for actual period), Aluminum bumps on Si
Substrate: Silicon about 4x3 mm Default mounting: On 12 or 15 mm diameter steel disk. Available unmounted on request
Available mounted on SEM stub (300-2D-SEM) Default mounting: on pin stub type A using colloidal graphite paint. Colloidal silver paint or adhesive carbon tab available on request. Carbon tab not recommended for pitch < 500 nm. See mount descriptions.
Available as miniature version with die size about 0.9x0.9 mm (300-2D-Mini). Sold unmounted only. Recommended for applications where low mass and/or small size are advantageous.
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