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70-1DUTC
5375.00 USD
Traceable, mounted on steel disc
Product availability: On stock

70-1D

Calibration Specimen, 1-dimensional, 70nm Nominal Period, HSQ Resist (Silicon Oxide) on Si.

Product Description
70-1D Calibration Specimen, 1-dimensional, 70 nm nominal period (refer to certificate for actual period), HSQ resist (silicon oxide) on Si.

Substrate: Silicon about 4x3 mm.

Mounted on 15 mm diam. steel disk.

Contact us for availability of non-traceable version.
 
Not available unmounted!

Available mounted on SEM stub
Default mounting: on pin stub type A using colloidal graphite paint. 
Colloidal silver paint or adhesive carbon tab available on request.  
Carbon tab not recommended for pitch < 500 nm.
See mount descriptions.

Re-Calibration traceable to National Laboratory available for $2891.
Recertification policy: we do not clean the specimens. If our inspection shows that the specimen is not in good enough condition for recertification, we will offer you a new specimen at 80% of the original price.
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