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ISNE

AFM Probe Tip characterizer: Sharp Silicon "Nanoedge" with Steep Slope

Product Description

Layout:
88 cells on 1 x 1 mm area on 6 x 6 silicon chip

Specifications:
  • - Edge recessed against top surface
  • - Material: Silicon
  • - Usable edge length: 1 to 2µm
  • - Top edge radius: < 10 nm
  • - Edge width variation: < 3 nm
  • - Upper slope angle: < 8°

Special layout makes it easy, to return with a tip always to the identical characterizer position. Many identical sites on a single characterizer chip help to increase lifetime.
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