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Order Code / Price*
ARROW-CONT-10 Box of 10 AFM Probes
297.00 USD
ARROW-CONT-20 Box of 20 AFM Probes
534.00 USD
Your volume discount is 60.00 USD or 10.10%
ARROW-CONT-50 Box of 50 AFM Probes
1177.00 USD
Your volume discount is 308.00 USD or 20.70%
ARROW-CONT-W Box of 380 AFM Probes
6050.00 USD
Your volume discount is 5236.00 USD or 46.40%
Product availability: On stock


Contact Mode AFM Probe with Tip at the Very End of the Cantilever

Manufacturer: NanoWorld

Coating: none
AFM tip shape: Arrow
AFM Cantilever
F 14 kHz
C 0.2 N/m
L 450 µm
*nominal values


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Optimized positioning through maximized tip visibility

NanoWorld Arrow CONT probes are designed for Contact Mode imaging. Furthermore this type can be used for Force Distance Spectroscopy Mode or Pulsed Force Mode (PFM). The CONT type is optimized for high sensitivity due to a low Force Constant.

All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM probes feature a rectangular AFM cantilever with a triangular free end and a tetrahedral AFM tip.

Additionally, this AFM probe offers an excellent tip radius of curvature.

The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the AFM tip on the area of interest.


AFM Tip:

  • AFM Cantilever:

  • Beam
  • 0.2 N/m (0.06 - 0.38 N/m)*
  • 14 kHz (10 - 19 kHz)*
  • 450 µm (445 - 455 µm)*
  • 45 µm (40 - 50 µm)*
  • 2 µm ( 1.5 - 2.5 µm)*
  • * typical range