AFM Probes » Arrow-FM

 Order
 Request a quote (RFQ)
Order Code / Price*
Quantity
ARROW-FM-10 Box of 10 AFM Probes
245.00 USD
ARROW-FM-50 Box of 50 AFM Probes
975.00 USD
Your volume discount is 250.00 USD or 20.40%
ARROW-FM-W Box of 380 AFM Probes
5 000.00 USD
Your volume discount is 4 310.00 USD or 46.30%
Product availability: On stock

Arrow-FM

Force Modulation AFM Probe with Tip at the Very End of the Cantilever

Coating: none
Tip shape: Arrow
Cantilever:
F 75 kHz
C 2.8 N/m
L 240 µm
*nominal values

Applications

Optimized positioning through maximized tip visibility

NanoWorld Arrow™ FM probes are designed for Force Modulation Mode imaging. The Force Constant of the FM type fills the gap between Contact and Non-Contact probes. Furthermore Non-Contact / TappingMode™ imaging is possible with this AFM probe.

All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip.

Additionally, this probe offers an excellent tip radius of curvature.

The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.

Uncoated

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 2.8 N/m (1.4 - 5.8 N/m)*
  • 75 kHz (58 - 97 kHz)*
  • 240 µm (235 - 245 µm)*
  • 35 µm (30 - 40 µm)*
  • 3 µm (2.5 - 3.5 µm)*
  • * typical range
    Loading
    nanosensors-logo nanoworld-logo budgetsensors-logo mikromasch-logo opus-logo nanotools-logo