Optimized positioning through maximized tip visibility
NanoWorld Arrow™ FM AFM probes are designed for Force Modulation Mode imaging. The Force Constant of the FM type fills the gap between Contact and Non-Contact probes. Furthermore Non-Contact / TappingMode™ imaging is possible with this AFM probe.
All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM probes feature a rectangular AFM cantilever with a triangular free end and a tetrahedral AFM tip.
Additionally, this AFM probe offers an excellent tip radius of curvature.
The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the AFM tip on the area of interest.