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ARROW-NCPt

Order Code / Price*

Quantity

ARROW-NCPt-10 Box of 10 AFM Probes

479 479.00 USD

Volume Discount Available [?]

ARROW-NCPt-20 Box of 20 AFM Probes

854 854.00 USD

Your volume discount is 104.00 USD or 10.90%

ARROW-NCPt-50 Box of 50 AFM Probes

1890 1890.00 USD

Your volume discount is 505.00 USD or 21.10%

ARROW-NCPt-W Box of 380 AFM Probes

10152 10152.00 USD

Your volume discount is 8050.00 USD or 44.20%

Product availability: On stock

Top view SEM image of ARROW™ AFM cantilever

SEM images of ARROW™ AFM tip

ARROW-NCPt

Electrical, Tapping Mode AFM Probe with Tip at the Very End of the Cantilever

Manufacturer: NanoWorld

Coating: Electrically Conductive
AFM tip shape: Arrow

AFM Cantilever

F 285 kHz

C 42 N/m

L 160 µm

*nominal values

Applications

Conductive AFM Probes

How to optimize AFM scan parameters

How to use on Bruker® AFM systems

How to use standard AFM Probes on Park AFM Systems

Optimized positioning through maximized tip visibility

NanoWorld Arrow™ NCPt AFM probes are designed for non-contact or tapping mode imaging. This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM probes feature a rectangular AFM cantilever with a triangular free end and a tetrahedral AFM tip.

Additionally, this AFM tip offers an excellent tip radius of curvature.

The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the AFM tip on the area of interest.

PtIr5 Coating

The PtIr5 coating consists of a 23 nm thick platinum iridium5 layer deposited on both sides of the AFM cantilever. The tip side coating enhances the conductivity of the AFM tip and allows electrical contacts. The detector side coating enhances the reflectance of the laser beam by a factor of 2 and prevents light from interfering within the AFM cantilever.

The coating process is optimized for stress compensation and wear resistance. Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode. As the coating is almost stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:

Shape: Arrow

Radius: < 25 nm

AFM Cantilever:

Shape: Beam

Force Constant: 42 N/m (27 - 80 N/m)*

Resonance Frequency: 285 kHz (240 - 380 kHz)*

Length: 160 µm (155 - 165 µm)*

Width: 45 µm (40 - 50 µm)*

Thickness: 4.6 µm ( 4.1 - 5.1 µm)*

* typical range

Interested in learning about how this AFM probe has been used by fellow researchers?

Visit the manufacturer’s website for a list of publications mentioning this AFM probe.