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Order Code / Price*
ATEC-CONT-10 Box of 10 AFM Probes
445.00 USD
ATEC-CONT-50 Box of 50 AFM Probes
1 755.00 USD
Your volume discount is 470.00 USD or 21.10%
Product availability: On stock


Contact Mode AFM Probe with REAL Tip Visibility

Manufacturer: NANOSENSORS

Coating: none
AFM tip shape: Visible
AFM cantilever:
F 15 kHz
C 0.2 N/m
L 450 µm
*nominal values


NANOSENSORS™ AdvancedTEC™ Cont AFM probes are designed for contact mode imaging. They feature a tetrahedral tip that protrudes from the very end of the cantilever. This unique feature allows precise positioning and makes the AdvancedTEC™ the only AFM scanning probe in the world that offers REAL TIP VISIBILITY FROM TOP, even when the probe is tilted due to its mounting onto the AFM head. This feature makes them the premium choice for all applications where the tip has to be placed exactly on the point of interest and/or has to be visible (e.g. Nanomanipulation).

Due to their very small half cone angles the tips of the AdvancedTEC™ Series show great performance on samples that have a small pattern size combined with steep sample features.

The probe offers unique features:

  • excellent tip radius of curvature
  • monolithic silicon
  • highly doped silicon to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity


AFM Tip:

  • AFM Cantilever:

  • Beam
  • 0.2 N/m (0.02 - 0.75 N/m)*
  • 15 kHz (7 - 25 kHz)*
  • 450 µm (440 - 460 µm)*
  • 50 µm (45 - 55 µm)*
  • 2 µm ( 1 - 3 µm)*
  • * typical range
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