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Order Code / Price*
ATEC-NCPt-10 Box of 10 AFM Probes
890.00 USD
ATEC-NCPt-20 Box of 20 AFM Probes
1590.00 USD
Your volume discount is 190.00 USD or 10.70%
ATEC-NCPt-50 Box of 50 AFM Probes
3510.00 USD
Your volume discount is 940.00 USD or 21.10%
Product availability: On stock


Electrical, Tapping Mode AFM Probe with REAL Tip Visibility

Manufacturer: NANOSENSORS

Coating: Electrically Conductive
AFM tip shape: Visible
AFM Cantilever
F 335 kHz
C 45 N/m
L 160 µm
*nominal values
How to optimize AFM scan parameters gear icon

NANOSENSORS™ AdvancedTEC™ NCPt AFM AFM tips are designed for non-contact or tapping mode imaging. They feature a tetrahedral AFM tip that protrudes from the very end of the AFM cantilever.

This unique feature allows precise positioning and makes the AdvancedTEC™ the only AFM scanning probe in the world that offers REAL TIP VISIBILITY FROM TOP, even when the AFM probe is tilted due to its mounting onto the AFM head. This feature makes them the premium choice for all applications where the AFM tip has to be placed exactly on the point of interest and/or has to be visible (e.g. Nanomanipulation).

Due to their very small half cone angles the AFM tips of the AdvancedTEC™ Series show great performance on samples that have a small pattern size combined with steep sample features. 

The AFM probe offers unique features:

  • metallic conductivity of the AFM tip
  • high mechanical Q-factor for high sensitivity
  • aspect ratio of the last 1.5 µm of the AFM tip > 4:1 (from front and side)
  • AFM tip shape is defined by real crystal planes resulting in highly reproducible geometries and extremely smooth surfaces
  • highly doped single crystal silicon (0.01-0.025 Ohm*cm)
  • rectangular AFM cantilever with trapezoidal cross section
  • holder dimensions are 1.6 mm x 3.4 mm

Please note: Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode or where it is necessary to conduct high currents.

The metallic coating is an approximately 25 nm thick double layer of chromium and platinum iridium5 on both sides of the AFM cantilever. The AFM tip side coating enhances the conductivity of the AFM tip and allows electrical contacts. The detector side coating enhances the reflectivity of the laser beam by a factor of about 2 and prevents light from interfering within the AFM cantilever. The coating process is optimized for stress compensation and wear resistance.
AFM Tip:

  • AFM Cantilever:
  • Beam
  • 45 N/m (12 - 110 N/m)*
  • 335 kHz (210 - 490 kHz)*
  • 160 µm (150 - 170 µm)*
  • 45 µm (40 - 50 µm)*
  • 4.6 µm ( 3.6 - 5.6 µm)*
  • * guaranteed range