AFM Probes » Akiyama-Probe

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A-PROBE-10 Box of 10 AFM Probes
660.00 USD
Product availability: On stock

Akiyama-Probe

best of the best

Novel self-sensing, self-actuating AFM probe for dynamic mode AFM

Coating: none
Tip shape: Visible
Cantilever:
F 50 kHz
C 5 N/m
L 310 µm
*nominal values

Applications

Novel self-sensing and self-actuating (-exciting) probe for dynamic mode Atomic Force Microscopy (AFM)

Akiyama-Probe is based on a quartz tuning fork combined with a micromachined cantilever. The great advantage of this novel probe is that one can benefit from both the tuning fork's extremely stable oscillation and the silicon cantilever's reasonable spring constant with one probe.

Akiyama-Probe is equipped with a special version of the NANOSENSORS™ AdvancedTEC, a high-end sharp silicon tip and has an excellent imaging capability on various samples with different properties, which is as high as that of a conventional optical lever system.

Akiyama-Probe requires neither optical detection, nor an external shaker. Akiyama-Probe occupies only a small volume above the sample. These features make it very attractive for creating a new generation of scanning probe microscopy (SPM) instruments.

Important notice!

Akiyama-Probe is not a plug-and-play probe. If it is not used in an AFM specifically built for its use as offered by some manufacturers it needs its own specific set-up to work. For more information on this set-up please have a look here.

Uncoated

AFM Tip:


  • AFM Cantilever:

  • Double beam
  • 5 N/m
  • 50 kHz
  • 310 µm
  • 30 µm
  • 3.7 µm
  • * typical range
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