Rectangular / Diving Board AFM Cantilevers (Double Beam)

Applications

Non-Contact / Tapping Mode AFM Probes

Non-Contact / Standard Tapping Mode AFM Probes

Non-Contact / Soft Tapping Mode AFM Probes

Fluid Tapping AFM Probes

ScanAsyst®** AFM Probes

Ultra High Frequency , Ultra Short AFM Cantilevers

Hardened/ Enhanced Wear Resistance Tapping AFM Probes

High Quality Factor AFM Cantilevers

Supersharp Tapping Mode AFM Probes

Force Modulation (FM) AFM Probes

Contact Mode AFM Probes

Life Science AFM Probes

Ultra High Frequency AFM Probes

Conductive AFM Probes

Magnetic AFM Probes

Supersharp AFM Probes

Diamond AFM Probes

Hardened / Enhanced Wear Resistance AFM Probes

Nanoindentation and Lithography AFM Probes

High Aspect Ratio (HAR) AFM Probes

PeakForce Tapping™ AFM Probes

ScanAsyst®** AFM Probes

PeakForce Kelvin Probe Force Microscopy AFM Probes

PeakForce TUNA™ AFM Probes

PeakForce Quantitative Nanomechanics AFM Probes

PeakForce QNM High-Accuracy AFM Probes

ScanAsyst®** AFM Probes

Silicon Nitride AFM Probes

Lateral Force Microscopy (LFM) AFM Probes

Tipless AFM Cantilevers and Cantilever Arrays

Self-Sensing & Self-Actuating AFM Probes

Sphere AFM Tips and Colloidal AFM Probes by sQube

Platinum Silicide AFM Probes

OLYMPUS Replacement AFM Probes

OMCL-AC160TS Replacement AFM Probes

OMCL-AC240TS Replacement AFM Probes

OMCL-AC200TS Replacement AFM Probes

OMCL-AC55TS Replacement AFM Probes

OMCL-AC240TM Replacement AFM Probes

OMCL-TR800PSA Replacement AFM Probes

Original and unaltered OLYMPUS AFM probes

Premounted AFM Probes