AFM Probes » All-In-One-DD

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Order Code / Price*
Quantity
AIO-DD-5 Box of 5 AFM Probes
730.00 USD
AIO-DD-20 Box of 20 AFM Probes
1 995.00 USD
Your volume discount is 925.00 USD or 31.70%
AIO-DD-50 Box of 50 AFM Probes
4 970.00 USD
Your volume discount is 2 330.00 USD or 31.90%
Product availability: On stock
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All-In-One-DD

Diamond Coated, Conductive AFM Probe with 4 Different Cantilevers

Coating: Conductive Diamond
Tip shape: Rotated
This probe features 4 cantilevers
F 19 kHz
C 0.5 N/m
L 500 µm
F 110 kHz
C 6.5 N/m
L 210 µm
F 200 kHz
C 18 N/m
L 150 µm
F 450 kHz
C 100 N/m
L 100 µm
*nominal values

Applications

Versatile monolithic silicon AFM probe with 4 different cantilevers on a single AFM holder chip for various applications: nanoindentation, nanolithography and electric modes such as: 

  • scanning capacitance microscopy (SCM)
  • electrostatic force microscopy (EFM)
  • Kelvin probe force microscopy (KFM)
  • conductive atomic force microscopy (C-AFM).

The short cantilever end is marked by a trapezoidal pattern visible with bare eyes.

The doped polycristalline diamond tip coating provides unprecedented hardness and durability, as well as electridcal conductivity for demanding electrical applications. The resulting tip radius is in the range 100-300nm.

The rotated tips allow for more symmetric representation of high sample features.

The AFM holder chip fits most commercial AFM systems as it is industry standard size.

The main advantage of this product compared to regular, single-cantilever AFM probes is the freedom to choose the right cantilever for each application in the very last moment. You do not need to stock various AFM probe types any more. Nevertheless, this product is not meant as a substitution to comparable single-cantilever AFM probes, because the geometry of each one of the All-In-One cantilevers differs from the geometry of the comparable specialized single-cantilever AFM probes.

Please note that the aluminum back side coating is not suitable for measurements in liquids!

Consistent high quality at a lower price!

Boron doped polycrystalline diamond tip coating, 100 nm thick; Aluminum coating on detector side of the cantilever, 30 nm thick.

AFM Tip:


  • 4 AFM Cantilevers:

    Cantilever A - Contact Mode
  • Beam
  • 0.5 N/m (0.2 - 0.9 N/m)*
  • 19 kHz (16 - 24 kHz)*
  • 500 µm (490 - 510 µm)*
  • 30 µm (25 - 35 µm)*
  • 2.7 µm (1.7 - 3.7 µm)*
  • Cantilever B - Force Modulation
  • Beam
  • 6.5 N/m (3 - 12 N/m)*
  • 110 kHz (80 - 140 kHz)*
  • 210 µm (200 - 220 µm)*
  • 30 µm (25 - 35 µm)*
  • 2.7 µm (1.7 - 3.7 µm)*
  • Cantilever C - Soft Tapping
  • Beam
  • 18 N/m (8 - 35 N/m)*
  • 200 kHz (140 - 260 kHz)*
  • 150 µm (140 - 160 µm)*
  • 30 µm (25 - 35 µm)*
  • 2.7 µm (1.7 - 3.7 µm)*
  • Cantilever D - Tapping Mode
  • Beam
  • 100 N/m (48 - 190 N/m)*
  • 450 kHz (230 - 600 kHz)*
  • 100 µm (90 - 110 µm)*
  • 50 µm (45 - 55 µm)*
  • 2.7 µm (1.7 - 3.7 µm)*
  • * typical range
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