Versatile micromachined monolithic silicon AFM probe with 4 different AFM cantilevers on a single holder chip for various applications: contact mode, force modulation mode, soft tapping mode and high frequency tapping / non-contact mode, and electric modes such as:
The main advantage of the All-In-One series compared to single-cantilever AFM probes is the freedom to choose the right AFM cantilever for each application on the fly, thus avoiding the need to stock various AFM probe types.
The doped polycrystalline diamond AFM tip coating provides unprecedented hardness and durability, as well as electridcal conductivity for demanding electrical applications. The resulting AFM tip radius is in the range 100-300 nm. The rotated AFM tips provide more symmetric representation of high sample features.
The AFM probe features a reflective aluminum coating on the back side of the AFM cantilevers. It is not suitable for measurements in liquids.
With its industry standard dimensions of 3.4 x 1.6 x 0.3 mm the holder chip fits most commercial AFM systems. There are 2 AFM cantilevers on each end of the chip. The end of the chip with the two shorter, stiffer and higher resonance frequency AFM cantilevers is marked by a trapezoidal pattern visible with the naked eye.
Consistent high quality at a lower price!