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Quantity
AIO-DD-5 Box of 5 AFM Probes
760.00 USD
AIO-DD-20 Box of 20 AFM Probes
2290.00 USD
Your volume discount is 750.00 USD or 24.70%
AIO-DD-50 Box of 50 AFM Probes
5100.00 USD
Your volume discount is 2500.00 USD or 32.90%
Product availability: On stock

All-In-One-DD

best bang for your buck

Diamond Coated, Conductive AFM Probe with 4 Different AFM Cantilevers

Manufacturer: BudgetSensors

Coating: Conductive Diamond
AFM tip shape: Rotated
This probe features 4 cantilevers
F 19 kHz
C 0.5 N/m
L 500 µm
F 110 kHz
C 6.5 N/m
L 210 µm
F 200 kHz
C 18 N/m
L 150 µm
F 450 kHz
C 100 N/m
L 100 µm
*nominal values
Applications
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Versatile micromachined monolithic silicon AFM probe with 4 different AFM cantilevers on a single holder chip for various applications: contact mode, force modulation mode, soft tapping mode and high frequency tapping / non-contact mode, and electric modes such as:

  • electrostatic force microscopy (EFM)
  • Kelvin probe force microscopy (KPFM)
  • scanning capacitance microscopy (SCM)
  • piezoresponse force microscopy (PFM)
  • conductive AFM (C-AFM)

The main advantage of the All-In-One series compared to single-cantilever AFM probes is the freedom to choose the right AFM cantilever for each application on the fly, thus avoiding the need to stock various AFM probe types.

The doped polycrystalline diamond AFM tip coating provides unprecedented hardness and durability, as well as electridcal conductivity for demanding electrical applications. The resulting AFM tip radius is in the range 100-250 nm. The rotated AFM tips provide more symmetric representation of high sample features.

The AFM probe features a reflective aluminum coating on the back side of the AFM cantilevers. It is not suitable for measurements in liquids.

With its industry standard dimensions of 3.4 x 1.6 x 0.3 mm the holder chip fits most commercial AFM systems. There are 2 AFM cantilevers on each end of the chip. The end of the chip with the two shorter, stiffer and higher resonance frequency AFM cantilevers is marked by a trapezoidal pattern visible with the naked eye.

Consistent high quality at a lower price!

Boron doped polycrystalline diamond tip coating, 100 nm thick; Aluminum coating on detector side of the cantilever, 30 nm thick.
AFM Tip:

  • 4 AFM Cantilevers:
    Cantilever A - Contact Mode
  • Beam
  • 0.5 N/m (0.2 - 0.9 N/m)*
  • 19 kHz (16 - 24 kHz)*
  • 500 µm (490 - 510 µm)*
  • 30 µm (25 - 35 µm)*
  • 2.7 µm ( 1.7 - 3.7 µm)*
  • Cantilever B - Force Modulation
  • Beam
  • 6.5 N/m (3 - 12 N/m)*
  • 110 kHz (80 - 140 kHz)*
  • 210 µm (200 - 220 µm)*
  • 30 µm (25 - 35 µm)*
  • 2.7 µm ( 1.7 - 3.7 µm)*
  • Cantilever C - Soft Tapping
  • Beam
  • 18 N/m (8 - 35 N/m)*
  • 200 kHz (140 - 260 kHz)*
  • 150 µm (140 - 160 µm)*
  • 30 µm (25 - 35 µm)*
  • 2.7 µm ( 1.7 - 3.7 µm)*
  • Cantilever D - Tapping Mode
  • Beam
  • 100 N/m (48 - 190 N/m)*
  • 450 kHz (230 - 600 kHz)*
  • 100 µm (90 - 110 µm)*
  • 50 µm (45 - 55 µm)*
  • 2.7 µm ( 1.7 - 3.7 µm)*
  • * typical range
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