Diamond Coated, Conductive AFM Probe with 4 Different Cantilevers
Versatile monolithic silicon AFM probe with 4 different cantilevers on a single AFM holder chip for various applications: nanoindentation, nanolithography and electric modes such as:
The short cantilever end is marked by a trapezoidal pattern visible with bare eyes.
The doped polycristalline diamond tip coating provides unprecedented hardness and durability, as well as electridcal conductivity for demanding electrical applications. The resulting tip radius is in the range 100-300nm.
The rotated tips allow for more symmetric representation of high sample features.
The AFM holder chip fits most commercial AFM systems as it is industry standard size.
The main advantage of this product compared to regular, single-cantilever AFM probes is the freedom to choose the right cantilever for each application in the very last moment. You do not need to stock various AFM probe types any more. Nevertheless, this product is not meant as a substitution to comparable single-cantilever AFM probes, because the geometry of each one of the All-In-One cantilevers differs from the geometry of the comparable specialized single-cantilever AFM probes.
Please note that the aluminum back side coating is not suitable for measurements in liquids!
Consistent high quality at a lower price!