4 AFM Cantilevers per AFM Probe (2 cantilevers on each side)

29 results matching your criteria
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PNP-TR

PNP-TR

Silicon Nitride AFM Probe
Coating: Reflex (Au)
Tip Shape: Pyramid
Cantilevers: 4
F 67 kHz
C 0.32 N/m
L 100 µm
F 17 kHz
C 0.08 N/m
L 200 µm
PNP-DB

PNP-DB

Silicon Nitride AFM Probe
Coating: Reflex (Au)
Tip Shape: Pyramid
Cantilevers: 4
F 67 kHz
C 0.48 N/m
L 100 µm
F 17 kHz
C 0.06 N/m
L 200 µm
New
XNC12/Cr-Au BS

XNC12/Cr-Au BS

AFM Probe with 2 Different Gold Coated Silicon Nitride Cantilevers on Each Side of the Chip
Coating: Reflex (Au)
Tip Shape: Pyramid
Cantilevers: 4
F 17 kHz
C 0.08 N/m
L 200 µm
F 67 kHz
C 0.32 N/m
L 100 µm
HQ:XSC11/Al BS

HQ:XSC11/Al BS

AFM Probe with 4 Different Cantilevers for Various Applications
Coating: Reflex Aluminum
Tip Shape: Rotated
Cantilevers: 4
F 15 kHz
C 0.2 N/m
L 500 µm
F 80 kHz
C 2.7 N/m
L 210 µm
F 155 kHz
C 7 N/m
L 150 µm
F 350 kHz
C 42 N/m
L 100 µm
All-In-One-Al

All-In-One-Al

AFM Probe with 4 Different Cantilevers for Various Applications
Coating: Reflex Aluminum
Tip Shape: Rotated
Cantilevers: 4
F 15 kHz
C 0.2 N/m
L 500 µm
F 80 kHz
C 2.7 N/m
L 210 µm
F 150 kHz
C 7.4 N/m
L 150 µm
F 350 kHz
C 40 N/m
L 100 µm
HQ:XSC11/No Al

HQ:XSC11/No Al

AFM Probe with 4 Different Cantilevers for Various Applications
Coating: none
Tip Shape: Rotated
Cantilevers: 4
F 15 kHz
C 0.2 N/m
L 500 µm
F 80 kHz
C 2.7 N/m
L 210 µm
F 155 kHz
C 7 N/m
L 150 µm
F 350 kHz
C 42 N/m
L 100 µm
All-In-One

All-In-One

AFM Probe with 4 Different Cantilevers for Various Applications
Coating: none
Tip Shape: Rotated
Cantilevers: 4
F 15 kHz
C 0.2 N/m
L 500 µm
F 80 kHz
C 2.7 N/m
L 210 µm
F 150 kHz
C 7.4 N/m
L 150 µm
F 350 kHz
C 40 N/m
L 100 µm
HQ:XSC11/Hard/Al BS

HQ:XSC11/Hard/Al BS

AFM Probe with 4 Different Long Scanning, DLC Hardened Cantilevers for Various Applications
Coating: Hard Diamond-Like-Carbon
Tip Shape: Rotated
Cantilevers: 4
F 15 kHz
C 0.2 N/m
L 500 µm
F 80 kHz
C 2.7 N/m
L 210 µm
F 155 kHz
C 7 N/m
L 150 µm
F 350 kHz
C 42 N/m
L 100 µm
All-In-One-DLC

All-In-One-DLC

Diamond-Like-Carbon Coated AFM Probe with 4 Different Cantilevers for Various Applications
Coating: Hard Diamond-Like-Carbon
Tip Shape: Rotated
Cantilevers: 4
F 15 kHz
C 0.2 N/m
L 500 µm
F 80 kHz
C 2.7 N/m
L 200 µm
F 150 kHz
C 7.4 N/m
L 150 µm
F 350 kHz
C 40 N/m
L 100 µm
4XC-NN

4XC-NN

AFM Probe with 4 Different Cantilevers  with Tips at the Very End of the Cantilevers
Coating: none
Tip Shape: OPUS
Cantilevers: 4
F 17 kHz
C 0.3 N/m
L 500 µm
F 75 kHz
C 2.5 N/m
L 240 µm
F 150 kHz
C 9 N/m
L 175 µm
F 1200 kHz
C 100 N/m
L 65 µm
SiNi

SiNi

Silicon Nitride AFM Probe with 2 Different Cantilevers on Each Side of the Chip
Coating: Reflex (Au)
Tip Shape: Pyramid
Cantilevers: 4
F 30 kHz
C 0.27 N/m
L 100 µm
F 10 kHz
C 0.06 N/m
L 200 µm
HQ:DPER-XSC11

HQ:DPER-XSC11

AFM Probe with 4 Different Electrical Cantilevers
Coating: Electrically Conductive
Tip Shape: Rotated
Cantilevers: 4
F 15 kHz
C 0.2 N/m
L 500 µm
F 80 kHz
C 2.7 N/m
L 210 µm
F 155 kHz
C 7 N/m
L 150 µm
F 350 kHz
C 42 N/m
L 100 µm
Mix and Match Box

Mix and Match Box

Mixed box: up to 400 MikroMasch AFM probes
Coating: various
Tip Shape: various
HQ:DPE-XSC11

HQ:DPE-XSC11

AFM Probe with 4 Different Electrical Cantilevers
Coating: Electrically Conductive
Tip Shape: Rotated
Cantilevers: 4
F 15 kHz
C 0.2 N/m
L 500 µm
F 80 kHz
C 2.7 N/m
L 210 µm
F 155 kHz
C 7 N/m
L 150 µm
F 350 kHz
C 42 N/m
L 100 µm
New
All-In-One-DD

All-In-One-DD

Diamond Coated, Conductive AFM Probe with 4 Different Cantilevers
Coating: Conductive Diamond
Tip Shape: Rotated
Cantilevers: 4
F 19 kHz
C 0.5 N/m
L 500 µm
F 110 kHz
C 6.5 N/m
L 210 µm
F 200 kHz
C 18 N/m
L 150 µm
F 450 kHz
C 100 N/m
L 100 µm
BudgetComboBox

BudgetComboBox

Mixed Box with 50 BudgetSensors AFM probes of your choice

Coating: various
Tip Shape: various
ElectriAll-In-One

ElectriAll-In-One

Electrical AFM Probe with 4 Different Cantilevers
Coating: Electrically Conductive
Tip Shape: Rotated
Cantilevers: 4
F 15 kHz
C 0.2 N/m
L 500 µm
F 80 kHz
C 2.7 N/m
L 210 µm
F 150 kHz
C 7.4 N/m
L 150 µm
F 350 kHz
C 40 N/m
L 100 µm
PNP-TR-Au

PNP-TR-Au

Gold Coated Silicon Nitride AFM Probe

Coating: (Au) Overall
Tip Shape: Pyramid
Cantilevers: 4
F 67 kHz
C 0.32 N/m
L 100 µm
F 17 kHz
C 0.08 N/m
L 200 µm
4XC-GG

4XC-GG

AFM Probe with 4 Different Gold Coated Cantilevers with Tips at the Very End of the Cantilevers
Coating: (Au) Overall
Tip Shape: OPUS
Cantilevers: 4
F 17 kHz
C 0.3 N/m
L 500 µm
F 75 kHz
C 2.5 N/m
L 240 µm
F 150 kHz
C 9 N/m
L 175 µm
F 1200 kHz
C 100 N/m
L 65 µm
New
XNC12/Cr-Au

XNC12/Cr-Au

AFM Probe with 2 Different Gold Coated Silicon Nitride Cantilevers on Each Side of the Chip
Coating: (Au) Overall
Tip Shape: Pyramid
Cantilevers: 4
F 17 kHz
C 0.08 N/m
L 200 µm
F 67 kHz
C 0.32 N/m
L 100 µm
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