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CONTSC

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Order Code / Price*
Quantity
CONTSC-10 Box of 10 AFM Probes
335.00 USD
CONTSC-50 Box of 50 AFM Probes
1324.00 USD
Your volume discount is 351.00 USD or 21.00%
CONTSC-W Box of 380 AFM Probes
7050.00 USD
Your volume discount is 5680.00 USD or 44.60%
Product availability: On stock

CONTSC

Contact Mode AFM Probe with Short Cantilever

Manufacturer: NanoWorld

Coating: none
AFM tip shape: Standard
AFM Cantilever
F 25 kHz
C 0.2 N/m
L 225 µm
*nominal values

Applications

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NanoWorld Pointprobe® CONTSC AFM probe is an alternative AFM cantilever type for contact mode applications. The length of the AFM cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode AFM probes for some AFM instruments. Additionally, this AFM probe type allows the application for lateral or friction force mode.

All AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

Additionally, this AFM probes offers an excellent tip radius of curvature.

This AFM probe features alignment grooves on the back side of the holder chip.

Uncoated

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 0.2 N/m (0.02 - 0.7 N/m)*
  • 25 kHz (10 - 39 kHz)*
  • 225 µm (220 - 230 µm)*
  • 48 µm (42.5 - 52.5 µm)*
  • 1 µm ( 0.5 - 1.5 µm)*
  • * typical range
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