AFM Probes » DT-CONTR

Order Code / Price*

Quantity

DT-CONTR-10 Box of 10 AFM Probes

1185 1 185.00 USD

Volume Discount Available [?]

DT-CONTR-20 Box of 20 AFM Probes

2120 2 120.00 USD

Your volume discount is 250.00 USD or 10.50%

DT-CONTR-50 Box of 50 AFM Probes

4677 4 677.00 USD

Your volume discount is 1 248.00 USD or 21.10%

Product availability: On stock

DT-CONTR

Diamond Coated Contact Mode AFM Probe

Coating: Diamond
Tip shape: Standard

Cantilever:

F 20 kHz

C 0.5 N/m

L 450 µm

*nominal values

Applications

NANOSENSORS^™ DT-CONTR probes are designed for contact mode (repulsive mode) AFM imaging. The CONT type is optimized for high sensitivity due to a low force constant.

For applications that require hard contact between tip and sample this SPM probe offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond. The typical macroscopic tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.

The probe offers unique features:

real diamond coating
high mechanical Q-factor for high sensitivity

This product features alignment grooves on the back side of the holder chip.

The DT Diamond Coating is an approximately 100 nm thick coating of polycrystalline diamond on the tip-side of the cantilever leading to an unsurpassed hardness of the tip. The raman spectrum of the coating verifies the real diamond coating.

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 3.5% of the cantilever length.