The DT-FMR AFM probe is designed for force modulation microscopy. The force constant of this AFM cantilever type spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The FM AFM probe serves also as a basis for magnetic coatings (MFM).Furthermore non-contact or tapping mode operation is possible with the FM sensor but with reduced operation stability.
For applications that require hard contact between AFM tip and sample this sensor offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond. The typical macroscopic AFM tip radius of curvature lies in the range between 100 and 200 nm. Nanoroughnesses in the 10 nm regime improve the resolution on flat surfaces.
The AFM probe offers unique features:
This product features alignment grooves on the back side of the holder chip.