NANOSENSORS™ DT-NCHR AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
For applications that require hard contact between tip and sample this AFM probe offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond. The typical macroscopic AFM tip radius of curvature lies is between 100 and 200 nm. Nanoroughnesses in the 10 nm regime improve the resolution on flat surfaces.
The AFM probe offers unique features:
This product features alignment grooves on the back side of the holder chip.