AFM Probes » EFM

Order Code / Price*

Quantity

EFM-10 Box of 10 AFM Probes

419 419.00 USD

Volume Discount Available [?]

EFM-20 Box of 20 AFM Probes

751 751.00 USD

Your volume discount is 87.00 USD or 10.40%

EFM-50 Box of 50 AFM Probes

1657 1657.00 USD

Your volume discount is 438.00 USD or 20.90%

EFM-W Box of 380 AFM Probes

8508 8508.00 USD

Your volume discount is 7414.00 USD or 46.60%

Product availability: On stock

SEM image of PointProbe AFM tip

EFM

Name: EFM
Brand: NanoWorld

the industry standard

Electrical, Force Modulation AFM Probe

Manufacturer: NanoWorld

Coating: Electrically Conductive
AFM tip shape: Standard

AFM Cantilever

F 75 kHz

C 2.8 N/m

L 225 µm

*nominal values

Applications

Conductive AFM Probes

How to optimize AFM scan parameters

How to use on Bruker® AFM systems

NanoWorld Pointprobe® EFM AFM probes are designed for electrostatic force microscopy. The force constant and the special coating of the EFM type are optimised for this type of application. This type of AFM probe yields a very high force sensitivity, while simultaneously enabling tapping^™ and lift mode operation.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

Additionally, this AFM tip offers an excellent tip radius of curvature.

This product features alignment grooves on the back side of the holder chip.

PtIr5 Coating

The PtIr5 coating consists of a 23 nm thick platinum iridium5 layer deposited on both sides of the AFM cantilever. The tip side coating enhances the conductivity of the AFM tip and allows electrical contacts. The detector side coating enhances the reflectance of the laser beam by a factor of 2 and prevents light from interfering within the AFM cantilever.

The coating process is optimized for stress compensation and wear resistance. Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode. As the coating is almost stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:

Shape: Standard

Radius: < 25 nm

AFM Cantilever:

Shape: Beam

Force Constant: 2.8 N/m (1.2 - 5.5 N/m)*

Resonance Frequency: 75 kHz (60 - 90 kHz)*

Length: 225 µm (220 - 230 µm)*

Width: 28 µm (22.5 - 32.5 µm)*

Thickness: 3 µm ( 2.5 - 3.5 µm)*

* typical range

AFM Probes » EFM

EFM

Electrical, Force Modulation AFM Probe

Manufacturer: NanoWorld

Applications

AFM Probe Description

Coating Description

Full Technical Data

AFM Tip:

AFM Cantilever:

AFM Probes » EFM

EFM

Electrical, Force Modulation AFM Probe

Manufacturer: NanoWorld

Applications

AFM Probe Description

Coating Description

Full Technical Data

AFM Tip:

AFM Cantilever:

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