AFM Probes » EFM

Order Code / Price*

Quantity

EFM-10 Box of 10 AFM Probes

419 419.00 USD

Volume Discount Available [?]

EFM-20 Box of 20 AFM Probes

751 751.00 USD

Your volume discount is 87.00 USD or 10.40%

EFM-50 Box of 50 AFM Probes

1657 1 657.00 USD

Your volume discount is 438.00 USD or 20.90%

EFM-W Box of 380 AFM Probes

8508 8 508.00 USD

Your volume discount is 7 414.00 USD or 46.60%

Product availability: On stock

EFM

the industry standard

Electrical, Force Modulation AFM Probe

Manufacturer: NanoWorld

Coating: Electrically Conductive
Tip shape: Standard

Cantilever:

F 75 kHz

C 2.8 N/m

L 225 µm

*nominal values

Applications

Conductive AFM Probes

NanoWorld Pointprobe® EFM probes are designed for electrostatic force microscopy. The force constant and the special coating of the EFM type are optimised for this type of application. This type of probe yields a very high force sensitivity, while simultaneously enabling tapping^™ and lift mode operation.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

Additionally, this AFM tip offers an excellent tip radius of curvature.

This product features alignment grooves on the back side of the holder chip.

PtIr5 Coating

The PtIr5 coating consists of a 23 nm thick platinum iridium5 layer deposited on both sides of the cantilever. The tip side coating enhances the conductivity of the tip and allows electrical contacts. The detector side coating enhances the reflectance of the laser beam by a factor of 2 and prevents light from interfering within the cantilever.

The coating process is optimized for stress compensation and wear resistance. Wear at the tip can occur if operating in contact-, friction- or force modulation mode. As the coating is almost stress-free the bending of the cantilever due to stress is less than 2 degrees.

AFM Tip:

Shape: Standard

Radius: < 25 nm

AFM Cantilever:

Shape: Beam

Force Constant: 2.8 N/m (1.2 - 5.5 N/m)*

Resonance Frequency: 75 kHz (60 - 90 kHz)*

Length: 225 µm (220 - 230 µm)*

Width: 28 µm (22.5 - 32.5 µm)*

Thickness: 3 µm ( 2.5 - 3.5 µm)*

* typical range

AFM Probes » EFM

EFM

Electrical, Force Modulation AFM Probe