AFM Probes » ElectriAll-In-One

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AIOE-10 Box of 10 AFM Probes
240.00 USD
Product availability: On stock

ElectriAll-In-One

Electrical AFM Probe with 4 Different AFM Cantilevers

Manufacturer: BudgetSensors

Coating: Electrically Conductive
AFM tip shape: Rotated
This probe features 4 cantilevers
F 15 kHz
C 0.2 N/m
L 500 µm
F 80 kHz
C 2.7 N/m
L 210 µm
F 150 kHz
C 7.4 N/m
L 150 µm
F 350 kHz
C 40 N/m
L 100 µm
*nominal values

Applications

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Versatile micromachined monolithic silicon AFM probe with 4 different AFM cantilevers on a single holder chip for various applications: contact mode, force modulation mode, soft tapping mode and high frequency tapping / non-contact mode, and electric modes such as:

  • electrostatic force microscopy (EFM)
  • Kelvin probe force microscopy (KPFM)
  • scanning capacitance microscopy (SCM)
  • piezoresponse force microscopy (PFM)

The main advantage of the All-In-One series compared to single-cantilever AFM probes is the freedom to choose the right AFM cantilever for each application on the fly, thus avoiding the need to stock various AFM probe types.

The consistent AFM tip radius of less than 25 nm ensures high resolution and good reproducibility. The rotated AFM tips provide more symmetric representation of high sample features.

The AFM probe features an overall chromium-platinum coating.

With its industry standard dimensions of 3.4 x 1.6 x 0.3 mm the holder chip fits most commercial AFM systems. There are 2 AFM cantilevers on each end of the chip. The end of the chip with the two shorter, stiffer and higher resonance frequency AFM cantilevers is marked by a trapezoidal pattern visible with the naked eye.

BudgetSensors offers consistent high quality at a lower price!

Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.

AFM Tip:


  • 4 AFM Cantilevers:

    Cantilever A - Contact Mode
  • Beam
  • 0.2 N/m (0.04 - 0.7 N/m)*
  • 15 kHz (10 - 20 kHz)*
  • 500 µm (490 - 510 µm)*
  • 30 µm (25 - 35 µm)*
  • 2.7 µm ( 1.7 - 3.7 µm)*
  • Cantilever B - Force Modulation
  • Beam
  • 2.7 N/m (0.4 - 10 N/m)*
  • 80 kHz (50 - 110 kHz)*
  • 210 µm (200 - 220 µm)*
  • 30 µm (25 - 35 µm)*
  • 2.7 µm ( 1.7 - 3.7 µm)*
  • Cantilever C - Soft Tapping
  • Beam
  • 7.4 N/m (1 - 29 N/m)*
  • 150 kHz (70 - 230 kHz)*
  • 150 µm (140 - 160 µm)*
  • 30 µm (25 - 35 µm)*
  • 2.7 µm ( 1.7 - 3.7 µm)*
  • Cantilever D - Tapping Mode
  • Beam
  • 40 N/m (7 - 160 N/m)*
  • 350 kHz (200 - 500 kHz)*
  • 100 µm (90 - 110 µm)*
  • 50 µm (45 - 55 µm)*
  • 2.7 µm ( 1.7 - 3.7 µm)*
  • * typical range
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