AFM Probes » FESP

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Order Code / Price*
Quantity
FESP-10 Box of 10 AFM Probes
279.00 USD
FESP-50 Box of 50 AFM Probes
1 104.00 USD
Your volume discount is 291.00 USD or 20.90%
FESP-W Box of 380 AFM Probes
5 672.00 USD
Your volume discount is 4 930.00 USD or 46.50%
Product availability: On stock

FESP

Standard Force Modulation AFM Probe

Coating: none
Tip shape: Standard
Cantilever:
F 75 kHz
C 2.8 N/m
L 225 µm
*nominal values

Applications

NanoWorld PointProbe® FM probes are designed for force modulation mode imaging. The force constant of the FM type fills the gap between contact and non-contact probes. Furthermore non-contact or tapping™ mode imaging is possible with this AFM probe.

All probes of the PointProbe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

Additionally, this probe offers an excellent tip radius of curvature.

This probe was sold by Veeco Instruments Inc. for over 10 years up until April 2007. Bruker Corporation, which acquired Veeco metrology business, is no longer selling the original probe which has always been manufactured by NanoWorld®.

This product features alignment grooves on the back side of the holder chip.

Uncoated

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 2.8 N/m (1.2 - 5.5 N/m)*
  • 75 kHz (60 - 90 kHz)*
  • 225 µm (220 - 230 µm)*
  • 28 µm (22.5 - 32.5 µm)*
  • 3 µm (2.5 - 3.5 µm)*
  • * typical range
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