AFM Probes » FESP

 Order
 Request a quote (RFQ)
Order Code / Price*
Quantity
FESP-10 Box of 10 AFM Probes
307.00 USD
FESP-50 Box of 50 AFM Probes
1215.00 USD
Your volume discount is 320.00 USD or 20.80%
FESP-W Box of 380 AFM Probes
6239.00 USD
Your volume discount is 5427.00 USD or 46.50%
Product availability: On stock

FESP

Standard Force Modulation AFM Probe

Manufacturer: NanoWorld

Coating: none
AFM tip shape: Standard
AFM Cantilever
F 75 kHz
C 2.8 N/m
L 225 µm
*nominal values

Applications

How to optimize AFM scan parameters gear icon

NanoWorld PointProbe® FM AFM probes are designed for force modulation mode imaging. The force constant of the FM type fills the gap between contact and non-contact AFM probes. Furthermore non-contact or tapping™ mode imaging is possible with this AFM probe.

All AFM probes of the PointProbe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

Additionally, this probe offers an excellent tip radius of curvature.

This AFM probe was sold by Veeco Instruments Inc. for over 10 years up until April 2007. Bruker Corporation, which acquired Veeco metrology business, is no longer selling the original AFM probe which has always been manufactured by NanoWorld®.

This product features alignment grooves on the back side of the holder chip.

Uncoated

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 2.8 N/m (1.2 - 5.5 N/m)*
  • 75 kHz (60 - 90 kHz)*
  • 225 µm (220 - 230 µm)*
  • 28 µm (22.5 - 32.5 µm)*
  • 3 µm ( 2.5 - 3.5 µm)*
  • * typical range
    Loading
    nanosensors-logo
    nanoworld-logo
    budgetsensors-logo
    mikromasch-logo
    opus-logo
    nanotools-logo