AFM Probes » FM

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Order Code / Price*
FM-10 Box of 10 AFM Probes
307.00 USD
FM-50 Box of 50 AFM Probes
1215.00 USD
Your volume discount is 320.00 USD or 20.80%
FM-W Box of 380 AFM Probes
6239.00 USD
Your volume discount is 5427.00 USD or 46.50%
Product availability: On stock


Standard Force Modulation AFM Probe

Manufacturer: NanoWorld

Coating: none
AFM tip shape: Standard
AFM Cantilever
F 75 kHz
C 2.8 N/m
L 225 µm
*nominal values


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NanoWorld PointProbe®FM AFM probes are designed for force modulation mode imaging. The force constant of the FM type fills the gap between contact and non-contact AFM probes. Furthermore non-contact or tapping™ mode imaging is possible with this AFM probe.

All AFM probes of the PointProbe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

Additionally, this AFM probe offers an excellent tip radius of curvature.

This product features alignment grooves on the back side of the holder chip.


AFM Tip:

  • AFM Cantilever:

  • Beam
  • 2.8 N/m (1.2 - 5.5 N/m)*
  • 75 kHz (60 - 90 kHz)*
  • 225 µm (220 - 230 µm)*
  • 28 µm (22.5 - 32.5 µm)*
  • 3 µm ( 2.5 - 3.5 µm)*
  • * typical range