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FM

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Order Code / Price*
Quantity
FM-10 Box of 10 AFM Probes
335.00 USD
FM-50 Box of 50 AFM Probes
1324.00 USD
Your volume discount is 351.00 USD or 21.00%
FM-W Box of 380 AFM Probes
7050.00 USD
Your volume discount is 5680.00 USD or 44.60%
Product availability: On stock

FM

Standard Force Modulation AFM Probe

Manufacturer: NanoWorld

Coating: none
AFM tip shape: Standard
AFM Cantilever
F 75 kHz
C 2.8 N/m
L 225 µm
*nominal values

Applications

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NanoWorld PointProbe®FM AFM probes are designed for force modulation mode imaging. The force constant of the FM type fills the gap between contact and non-contact AFM probes. Furthermore non-contact or tapping™ mode imaging is possible with this AFM probe.

All AFM probes of the PointProbe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

Additionally, this AFM probe offers an excellent tip radius of curvature.

This AFM probe features alignment grooves on the back side of the holder chip.

Uncoated

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 2.8 N/m (1.2 - 5.5 N/m)*
  • 75 kHz (60 - 90 kHz)*
  • 225 µm (220 - 230 µm)*
  • 28 µm (22.5 - 32.5 µm)*
  • 3 µm ( 2.5 - 3.5 µm)*
  • * typical range
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