AFM Probes » FM

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Order Code / Price*
Quantity
FM-10 Box of 10 AFM Probes
279.00 USD
FM-50 Box of 50 AFM Probes
1 104.00 USD
Your volume discount is 291.00 USD or 20.90%
FM-W Box of 380 AFM Probes
5 672.00 USD
Your volume discount is 4 930.00 USD or 46.50%
Product availability: On stock

FM

Standard Force Modulation AFM Probe

Coating: none
Tip shape: Standard
Cantilever:
F 75 kHz
C 2.8 N/m
L 225 µm
*nominal values

Applications

NanoWorld PointProbe®FM probes are designed for force modulation mode imaging. The force constant of the FM type fills the gap between contact and non-contact probes. Furthermore non-contact or tapping™ mode imaging is possible with this AFM probe.

All probes of the PointProbe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

Additionally, this probe offers an excellent tip radius of curvature.

This product features alignment grooves on the back side of the holder chip.

Uncoated

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 2.8 N/m (1.2 - 5.5 N/m)*
  • 75 kHz (60 - 90 kHz)*
  • 3 µm (2.5 - 3.5 µm)*
  • * typical range
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