AFM Probes » LTESP

 Order
 Request a quote (RFQ)
Order Code / Price*
Quantity
LTESP-10 Box of 10 AFM Probes
279.00 USD
LTESP-50 Box of 50 AFM Probes
1 104.00 USD
Your volume discount is 291.00 USD or 20.90%
LTESP-W Box of 380 AFM Probes
5 672.00 USD
Your volume discount is 4 930.00 USD or 46.50%
Product availability: On stock

LTESP

Tapping Mode AFM Probe, Long Cantilever

Coating: none
Tip shape: Standard
Cantilever:
F 190 kHz
C 48 N/m
L 225 µm
*nominal values

Applications

NanoWorld Pointprobe® NCL probes are designed for non-contact or tapping™ mode imaging and offer an alternative to our high frequency non-contact type NCH. The NCL type is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum cantilever length (> 125 µm). This probe combines high operation stability with outstanding sensitivity. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

Additionally, this probe offers an excellent tip radius of curvature.

This probe was sold by Veeco Instruments Inc. for over 10 years up until April 2007. Bruker Corporation, which acuired Veeco metrology business, is no longer selling the original probe which has always been manufactured by NanoWorld®.

This product features alignment grooves on the back side of the holder chip.

Uncoated

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 48 N/m (31 - 71 N/m)*
  • 190 kHz (160 - 210 kHz)*
  • 225 µm (220 - 230 µm)*
  • 38 µm (33 - 43 µm)*
  • 7 µm (6.5 - 7.5 µm)*
  • * typical range
    Loading
    nanosensors-logo nanoworld-logo budgetsensors-logo mikromasch-logo opus-logo nanotools-logo