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Quantity
LTESP-10 Box of 10 AFM Probes
335.00 USD
LTESP-50 Box of 50 AFM Probes
1324.00 USD
Your volume discount is 351.00 USD or 21.00%
LTESP-W Box of 380 AFM Probes
7050.00 USD
Your volume discount is 5680.00 USD or 44.60%
Product availability: On stock

LTESP

Tapping Mode AFM Probe, Long Cantilever

Manufacturer: NanoWorld

Coating: none
AFM tip shape: Standard
AFM Cantilever
F 190 kHz
C 48 N/m
L 225 µm
*nominal values
Applications
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NanoWorld Pointprobe® NCL AFM probes are designed for non-contact or tapping™ mode imaging and offer an alternative to our high frequency non-contact type NCH. The NCL type is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum AFM cantilever length (> 125 µm). This AFM probe combines high operation stability with outstanding sensitivity. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

Additionally, this AFM probe offers an excellent tip radius of curvature.

This AFM probe was sold by Veeco Instruments Inc. for over 10 years up until April 2007. Bruker Corporation, which acuired Veeco metrology business, is no longer selling the original AFM probe which has always been manufactured by NanoWorld®.

This AFM probe features alignment grooves on the back side of the holder chip.

Uncoated
AFM Tip:

  • AFM Cantilever:
  • Beam
  • 48 N/m (31 - 71 N/m)*
  • 190 kHz (160 - 210 kHz)*
  • 225 µm (220 - 230 µm)*
  • 38 µm (33 - 43 µm)*
  • 7 µm ( 6.5 - 7.5 µm)*
  • * typical range
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