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MFMR-10 Box of 10 AFM Probes
670.00 USD
MFMR-50 Box of 50 AFM Probes
2649.00 USD
Your volume discount is 701.00 USD or 20.90%
MFMR-W Box of 380 AFM Probes
13917.00 USD
Your volume discount is 11543.00 USD or 45.30%
Product availability: On stock


the industry standard

Hard Magnetic, Medium Momentum MFM AFM Probe

Manufacturer: NanoWorld

Coating: Magnetic
AFM tip shape: Standard
AFM Cantilever
F 75 kHz
C 2.8 N/m
L 225 µm
*nominal values
How to optimize AFM scan parameters gear icon

NanoWorld Pointprobe® MFM AFM probes are designed for magnetic force microscopy. The force constant and the special hard magnetic tip-side coating of the MFM type are optimised for this type of application. This type of AFM probe yields a very high force sensitivity, while simultaneously enabling tapping™ and lift mode operation.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

Additionally, this AFM probe offers unique features: 

  • excellent tip radius of curvature
  • high magnetic contrast and lateral resolution < 100 nm
  • electrically conductive coating

Soft magnetic samples may be influenced by the AFM tip magnetization!

This AFM probe features alignment grooves on the back side of the holder chip.

Hard Magnetic Coating / Aluminum Reflex Coating

The hard magnetic coating consists of a 40 nm thick cobalt alloy layer deposited on the tip side of the AFM cantilever which leads to a permanent magnetization of the tip with the direction usually along the tip axis. We recommend magnetizing the tip by means of a strong magnet (e.g. a NdFeB magnet, a few millimeters in size) prior to the measurement.

The aluminum reflex coating deposited on the detector side of the cantilever enhances the reflectance of the laser beam and prevents light from interfering within the cantilever.

As the coating is almost stress-free the bending of the cantilever due to stress is less than 2 degrees.
AFM Tip:

  • AFM Cantilever:
  • Beam
  • 2.8 N/m (1.2 - 5.5 N/m)*
  • 75 kHz (60 - 90 kHz)*
  • 225 µm (220 - 230 µm)*
  • 28 µm (22.5 - 32.5 µm)*
  • 3 µm ( 2.5 - 3.5 µm)*
  • * typical range