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Quantity
Multi75M-G-10 Box of 10 AFM Probes
240.00 USD
Multi75M-G-50 Box of 50 AFM Probes
1050.00 USD
Your volume discount is 150.00 USD or 12.50%
Product availability: On stock

MagneticMulti75-G

best bang for your buck

Hard Magnetic, Medium Momentum AFM Probe

Manufacturer: BudgetSensors

Coating: Magnetic
AFM tip shape: Rotated
AFM Cantilever
F 75 kHz
C 3 N/m
L 225 µm
*nominal values
Applications
How to optimize AFM scan parameters gear icon

Micromachined monolithic silicon AFM probe for magnetic force microscopy (MFM) operation.

The cobalt-alloy coated AFM tip has a magnetic moment of roughly 10^-13 emu and coercivity of roughly 300 Oe.

The consistent AFM tip radius of less than 60 nm ensures high resolution and good reproducibility. The rotated AFM tip provides more symmetric representation of high sample features.

The AFM probe features a reflective aluminum coating on the back side of the AFM cantilever.

With its industry standard dimensions of 3.4 x 1.6 x 0.3 mm the holder chip fits most commercial AFM systems.

Consistent high quality at a lower price!

This AFM probe features alignment grooves on the back side of the holder chip.

Hard magnetic, medium momentum coating on tip side of the cantilever and aluminium reflex coating on detector side of the cantilever
AFM Tip:

  • AFM Cantilever:
  • Beam
  • 3 N/m (1 - 7 N/m)*
  • 75 kHz (60 - 90 kHz)*
  • 225 µm (215 - 235 µm)*
  • 28 µm (23 - 33 µm)*
  • 3 µm ( 2 - 4 µm)*
  • * typical range
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