Micromachined monolithic silicon AFM probe for magnetic force microscopy (MFM) operation.
The cobalt-alloy coated AFM tip has a magnetic moment of roughly 10^-13 emu and coercivity of roughly 300 Oe.
The consistent AFM tip radius of less than 60 nm ensures high resolution and good reproducibility. The rotated AFM tip provides more symmetric representation of high sample features.
The AFM probe features a reflective aluminum coating on the back side of the AFM cantilever.
With its industry standard dimensions of 3.4 x 1.6 x 0.3 mm the holder chip fits most commercial AFM systems.
Consistent high quality at a lower price!
This AFM probe features alignment grooves on the back side of the holder chip.