Diamond Coated, Conductive Force Modulation AFM Probe
For applications that require hard contact between tip and sample this probe offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond.
The typical macroscopic tip radius of curvature lies in the range between 100 and 200 nm. Nanoroughnesses in the 10 nm regime improve the resolution on flat surfaces.
The CDT features a conductive diamond coating. Some typical applications for this AFM tip are Tunneling AFM (Conducting AFM) and Scanning Capacitance Microscopy (SCM).
This AFM probe features alignment grooves on the back side of the holder chip.