AFM Probes  »  
 Order
 Request a quote (RFQ)
Order Code / Price*
Quantity
NW-CDT-NCHR-10 Box of 10 AFM Probes
1525.00 USD
NW-CDT-NCHR-20 Box of 20 AFM Probes
2729.00 USD
Your volume discount is 321.00 USD or 10.50%
NW-CDT-NCHR-50 Box of 50 AFM Probes
6021.00 USD
Your volume discount is 1604.00 USD or 21.00%
Product availability: On stock

NW-CDT-NCHR

Diamond Coated, Conductive Tapping Mode AFM Probe

Manufacturer: NanoWorld

Coating: Diamond,Conductive Diamond
AFM tip shape: Standard
AFM Cantilever
F 400 kHz
C 80 N/m
L 125 µm
*nominal values
Applications
How to optimize AFM scan parameters gear icon

NanoWorld Pointprobe® NCH AFM probes are designed for non-contact or tapping mode imaging. This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

For applications that require hard contact between tip and sample this AFM probe offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond.

The typical macroscopic tip radius of curvature lies in the range between 100 and 200 nm. Nanoroughnesses in the 10 nm regime improve the resolution on flat surfaces.

The CDT features a conductive diamond coating. Some typical applications for this AFM tip are Tunneling AFM (Conducting AFM) and Scanning Capacitance Microscopy (SCM).

For applications requiring lower resonance frequencies or a AFM cantilever length exceeding 125 µm use NanoWorld Pointprobe type CDT-NCLR.

This AFM probe features alignment grooves on the back side of the holder chip.

Conductive Diamond Coating / Aluminum Reflex Coating

The conductive diamond coating consists of a 100 nm thick polycrystalline diamond layer deposited on the tip side of the AFM cantilever resulting in an unsurpassed hardness of the AFM tip. The coating is highly doped with boron which leads to a macroscopic resistivity of 0.003 - 0.005 Ohm•cm.

The aluminum reflex coating deposited on the detector side of the AFM cantilever enhances the reflectance of the laser beam and prevents light from interfering within the AFM cantilever.
AFM Tip:

  • AFM Cantilever:
  • Beam
  • 80 N/m (42 - 142 N/m)*
  • 400 kHz (280 - 510 kHz)*
  • 125 µm (120 - 130 µm)*
  • 30 µm (25 - 35 µm)*
  • 4 µm ( 3.5 - 4.5 µm)*
  • * typical range
    Loading
    nanosensors-logo
    nanoworld-logo
    budgetsensors-logo
    mikromasch-logo
    opus-logo
    sqube-logo
    nanotools-logo