For applications that require hard contact between AFM tip and sample this probe offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond.
The typical macroscopic AFM tip radius of curvature lies in the range between 100 and 200 nm. Nanoroughnesses in the 10 nm regime improve the resolution on flat surfaces.
This AFM probe features alignment grooves on the back side of the holder chip.