The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a micromechanical cantilever. This plateau is formed by focused ion beam milling out of a symmetrically etched tip building a rod on top of a conical tip.
NANOSENSORS™ PL2-NCH AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This type of AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.
Upon request customized larger plateau diameters can be realized. Other shapes are also possible upon request.
The probe offers unique features: