AFM Probes » PPP-CONT

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Order Code / Price*
Quantity
PPP-CONT-10 Box of 10 AFM Probes
320.00 USD
PPP-CONT-50 Box of 50 AFM Probes
1 265.00 USD
Your volume discount is 335.00 USD or 20.90%
PPP-CONT-W Box of 380 AFM Probes
6 409.00 USD
Your volume discount is 5 751.00 USD or 47.30%
Product availability: On stock

PPP-CONT

Standard Contact Mode AFM Probe

Coating: none
Tip shape: Standard
Cantilever:
F 13 kHz
C 0.2 N/m
L 450 µm
*nominal values

Applications

The new PointProbe®Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS PPP-CONT AFM probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.

The probe offers unique features:

  • excellent tip radius of curvature
  • highly doped silicon to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity

This product features alignment grooves on the back side of the holder chip.

Uncoated

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 0.2 N/m (0.02 - 0.77 N/m)*
  • 13 kHz (6 - 21 kHz)*
  • 450 µm (440 - 460 µm)*
  • 50 µm (42.5 - 57.5 µm)*
  • 2 µm (1 - 3 µm)*
  • * typical range
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