AFM Probes » PPP-CONTPt

Order Code / Price*

Quantity

PPP-CONTPt-10 Box of 10 AFM Probes

449 449.00 USD

Volume Discount Available [?]

PPP-CONTPt-20 Box of 20 AFM Probes

803 803.00 USD

Your volume discount is 95.00 USD or 10.60%

PPP-CONTPt-50 Box of 50 AFM Probes

1771 1 771.00 USD

Your volume discount is 474.00 USD or 21.10%

PPP-CONTPt-W Box of 380 AFM Probes

8973 8 973.00 USD

Your volume discount is 8 089.00 USD or 47.40%

Product availability: On stock

Side view SEM image of PointProbe AFM tip

Front view SEM image of PointProbe AFM tip

PPP-CONTPt

Name: PPP-CONTPt
Brand: NANOSENSORS

Electrical, Contact Mode AFM Probe

Manufacturer: NANOSENSORS

Coating: Electrically Conductive
AFM tip shape: Standard

AFM cantilever:

F 13 kHz

C 0.2 N/m

L 450 µm

*nominal values

Applications

Conductive AFM Probes

The new PointProbe^®Plus (PPP) combines the well-known features of the proven PointProbe^® series such as high application versatility and compatibility with most commercial SPMs with a more reproducible tip radius as well as a more defined tip shape. The minimized variation in tip shape provides more reproducible images.

NANOSENSORS™ PPP-CONTPt AFM probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The PPP-CONTPt type is optimized for high sensitivity due to a low force constant.

The probe offers unique features:

metallic conductivity of the tip
high mechanical Q-factor for high sensitivity

This product features alignment grooves on the back side of the holder chip.

The PtIr5 coating is an approximately 25 nm thick double layer of chromium and platinum iridium5 on both sides of the cantilever. The tip side coating enhances the conductivity of the tip and allows electrical contacts. The detector side coating enhances the reflectivity of the laser beam by a factor of about 2 and prevents light from interfering within the cantilever. The coating process is optimized for stress compensation and wear resistance. The bending of the cantilever due to stress is less than 3.5% of the cantilever length.

AFM Tip:

Shape: Standard

Radius: < 25 nm

AFM Cantilever:

Shape: Beam

Force Constant: 0.2 N/m (0.02 - 0.77 N/m)*

Resonance Frequency: 13 kHz (6 - 21 kHz)*

Length: 450 µm (440 - 460 µm)*

Width: 50 µm (42.5 - 57.5 µm)*

Thickness: 2 µm ( 1 - 3 µm)*

* typical range

AFM Probes » PPP-CONTPt

PPP-CONTPt

Electrical, Contact Mode AFM Probe

Manufacturer: NANOSENSORS

Applications

AFM Probe Description

Coating Description

Full Technical Data

AFM Tip:

AFM Cantilever:

AFM Probes » PPP-CONTPt

PPP-CONTPt

Electrical, Contact Mode AFM Probe

Manufacturer: NANOSENSORS

Applications

AFM Probe Description

Coating Description

Full Technical Data

AFM Tip:

AFM Cantilever:

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