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PPP-CONTR

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Order Code / Price*
Quantity
PPP-CONTR-10 Box of 10 AFM Probes
381.00 USD
PPP-CONTR-50 Box of 50 AFM Probes
1503.00 USD
Your volume discount is 402.00 USD or 21.10%
PPP-CONTR-W Box of 380 AFM Probes
7891.00 USD
Your volume discount is 6587.00 USD or 45.50%
Product availability: On stock

PPP-CONTR

best of the best

Standard Contact Mode AFM Probe

Manufacturer: NANOSENSORS

Coating: Reflective Aluminum
AFM tip shape: Standard
AFM Cantilever
F 13 kHz
C 0.2 N/m
L 450 µm
*nominal values

Applications

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The PointProbe® Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.

NANOSENSORSPPP-CONTR AFM probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The PPP-CONTR type is optimized for high sensitivity due to a low force constant.

The AFM probe offers unique features:

  • excellent AFM tip radius of curvature
  • highly doped silicon to dissipate static charge
  • Al coating on detector side of AFM cantilever
  • high mechanical Q-factor for high sensitivity

This AFM probe features alignment grooves on the back side of the holder chip.

The reflective coating is an approximately 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 0.2 N/m (0.02 - 0.77 N/m)*
  • 13 kHz (6 - 21 kHz)*
  • 450 µm (440 - 460 µm)*
  • 50 µm (42.5 - 57.5 µm)*
  • 2 µm ( 1 - 3 µm)*
  • * guaranteed range
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