The new PointProbe®Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible AFM AFM tip radius as well as a more defined AFM tip shape. The excellent AFM tip radius and the minimized variation in AFM tip shape provide more reproducible images and enhanced resolution.
The NANOSENSORS™ PPP-CONTSC is an alternative AFM cantilever type for contact mode applications. The length of AFM cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode AFM probes for some AFM instruments. Additionally, this AFM probe type allows the application for lateral or friction force mode.
The AFM probe offers unique features:
This product features alignment grooves on the back side of the holder chip.