AFM Probes » PPP-CONTSCPt

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Quantity
PPP-CONTSCPt-10 Box of 10 AFM Probes
449.00 USD
Volume Discount Available [?]
PPP-CONTSCPt-20 Box of 20 AFM Probes
803.00 USD
Your volume discount is 95.00 USD or 10.60%
PPP-CONTSCPt-50 Box of 50 AFM Probes
1 771.00 USD
Your volume discount is 474.00 USD or 21.10%
Product availability: On stock

PPP-CONTSCPt

Electrical, Contact Mode AFM Probe with Short AFM Cantilever

Manufacturer: NANOSENSORS

Coating: Electrically Conductive
AFM tip shape: Standard
AFM Cantilever
F 25 kHz
C 0.2 N/m
L 225 µm
*nominal values

Applications

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The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible AFM tip radius as well as a more defined AFM tip shape.

The NANOSENSORS™ PPP-CONTSCPt is an alternative AFM cantilever type for contact mode applications. The length of AFM cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode AFM probes for some AFM instruments. Additionally, this AFM probe type allows the application for lateral or friction force mode.

The AFM probe offers unique features:

  • metallic conductivity of the AFM tip
  • high mechanical Q-factor for high sensitivity
  • precise alignment of the AFM cantilever position (within +/- 2 µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series
Please note: Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode.

This product features alignment grooves on the back side of the holder chip.

The PtIr5 coating is an approximately 25 nm thick double layer of chromium and platinum iridium5 on both sides of the AFM cantilever. The AFM tip side coating enhances the conductivity of the AFM tip and allows electrical contacts. The detector side coating enhances the reflectivity of the laser beam by a factor of about 2 and prevents light from interfering within the AFM cantilever. The coating process is optimized for stress compensation and wear resistance. The bending of the AFM cantilever due to stress is less than 3.5% of the AFM cantilever length.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 0.2 N/m (0.01 - 1.87 N/m)*
  • 25 kHz (1 - 57 kHz)*
  • 225 µm (215 - 235 µm)*
  • 48 µm (40 - 55 µm)*
  • 1 µm ( 0.1 - 2 µm)*
  • * typical range
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