The PointProbe®Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.
The PPP-EFM AFM probe is offered for electrostatic force microscopy. An overall metallic coating (PtIr5) on both sides of the AFM cantilever increasing the electrical conductivity of the AFM tip. The force constant of this type is specially tailored for the electrostatic force microscopy yielding very high force sensitivity while simultaneously enabling tapping mode and lift mode operation.
The AFM probe offers unique features:
This AFM probe features alignment grooves on the back side of the holder chip.