The new PointProbe®Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a more reproducible AFM tip radius as well as a more defined AFM tip shape. The minimized variation in AFM tip shape provides more reproducible images.
The PPP-EFM AFM probe is offered for electrostatic force microscopy. An overall metallic coating (PtIr5) on both sides of the AFM cantilever increasing the electrical conductivity of the AFM tip. The force constant of this type is specially tailored for the electrostatic force microscopy yielding very high force sensitivity while simultaneously enabling tapping mode and lift mode operation.
The AFM probe offers unique features:
This product features alignment grooves on the back side of the holder chip.