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PPP-EFM

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Order Code / Price*
Quantity
PPP-EFM-10 Box of 10 AFM Probes
534.00 USD
PPP-EFM-50 Box of 50 AFM Probes
2104.00 USD
Your volume discount is 566.00 USD or 21.20%
PPP-EFM-W Box of 380 AFM Probes
11048.00 USD
Your volume discount is 9244.00 USD or 45.60%
Product availability: On stock

PPP-EFM

best of the best

Electrical, Force Modulation AFM Probe

Manufacturer: NANOSENSORS

Coating: Electrically Conductive
AFM tip shape: Standard
AFM Cantilever
F 75 kHz
C 2.8 N/m
L 225 µm
*nominal values

Applications

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The PointProbe®Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.

The PPP-EFM AFM probe is offered for electrostatic force microscopy. An overall metallic coating (PtIr5) on both sides of the AFM cantilever increasing the electrical conductivity of the AFM tip. The force constant of this type is specially tailored for the electrostatic force microscopy yielding very high force sensitivity while simultaneously enabling tapping mode and lift mode operation.

The AFM probe offers unique features:

  • metallic conductivity of the AFM tip
  • high mechanical Q-factor for high sensitivity
  • precise alignment of the AFM cantilever position (within +/-2µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series

Please note:

  • Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode.
  • Although this is possible, it is not recommended to use PtIr5 coated AFM tips for electrical contacting in applications where it is necessary to conduct high current. The very thin layer of PtIr5 is unable to support much current.

This AFM probe features alignment grooves on the back side of the holder chip.

The PtIr5 coating is an approximately 25 nm thick double layer of chromium and platinum iridium5 on both sides of the AFM cantilever. The AFM tip side coating enhances the conductivity of the AFM tip and allows electrical contacts. The detector side coating enhances the reflectivity of the laser beam by a factor of about 2 and prevents light from interfering within the AFM cantilever. The coating process is optimized for stress compensation and wear resistance. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 2.8 N/m (0.5 - 9.5 N/m)*
  • 75 kHz (45 - 115 kHz)*
  • 225 µm (215 - 235 µm)*
  • 28 µm (20 - 35 µm)*
  • 3 µm ( 2 - 4 µm)*
  • * guaranteed range
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