AFM Probes » PPP-FM

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Order Code / Price*
Quantity
PPP-FM-10 Box of 10 AFM Probes
320.00 USD
PPP-FM-50 Box of 50 AFM Probes
1 265.00 USD
Your volume discount is 335.00 USD or 20.90%
PPP-FM-W Box of 380 AFM Probes
6 409.00 USD
Your volume discount is 5 751.00 USD or 47.30%
Product availability: On stock

PPP-FM

Standard Force Modulation AFM Probe

Coating: none
Tip shape: Standard
Cantilever:
F 75 kHz
C 2.8 N/m
L 225 µm
*nominal values

Applications

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The PPP-FM tip serves also as a basis for magnetic coatings (MFM). Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.

The probe offers unique features:

  • excellent tip radius of curvature
  • highly doped silicon to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity
  • precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series

This product features alignment grooves on the back side of the holder chip.

Uncoated

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 2.8 N/m (0.5 - 9.5 N/m)*
  • 75 kHz (45 - 115 kHz)*
  • 225 µm (215 - 235 µm)*
  • 28 µm (20 - 35 µm)*
  • 3 µm (2 - 4 µm)*
  • * typical range
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