PPP-LFMR

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

For lateral or friction force microscopy NANOSENSORS™ offers a special type of AFM probe (LFM: lateral force microscopy). This sensor type is optimized for a high sensitivity to lateral or friction forces by an extremely soft, thin cantilever.

The probe offers unique features:

• excellent tip radius of curvature
• highly doped silicon to dissipate static charge
• Al coating on detector side of cantilever
• high mechanical Q-factor for high sensitivity
• precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
• compatible with PointProbe® Plus XY-Alignment Series

This product features alignment grooves on the back side of the holder chip.