PPP-NCH

The PointProbe® Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.

NANOSENSORS™ PPP-NCH AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This type of AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.

This AFM probe offers unique features:

• excellent AFM tip radius of curvature
• highly doped silicon to dissipate static charge
• chemically inert
• high mechanical Q-factor for high sensitivity

This AFM probe features alignment grooves on the back side of the holder chip.