PPP-NCH

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible AFM tip radius as well as a more defined AFM tip shape. The excellent AFM tip radius and the minimized variation in AFM tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS™ PPP-NCH AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This type of AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.

This AFM probe offers unique features:

• excellent AFM tip radius of curvature
• highly doped silicon to dissipate static charge
• chemically inert
• high mechanical Q-factor for high sensitivity

This product features alignment grooves on the back side of the holder chip.