AFM Probes  »  

PPP-NCLPt

 Order
 Request a quote (RFQ)
Order Code / Price*
Quantity
PPP-NCLPt-10 Box of 10 AFM Probes
534.00 USD
PPP-NCLPt-50 Box of 50 AFM Probes
2104.00 USD
Your volume discount is 566.00 USD or 21.20%
PPP-NCLPt-W Box of 380 AFM Probes
11048.00 USD
Your volume discount is 9244.00 USD or 45.60%
Product availability: On stock

PPP-NCLPt

Electrical, Tapping Mode AFM Probe with a Long AFM Cantilever

Manufacturer: NANOSENSORS

Coating: Electrically Conductive
AFM tip shape: Standard
AFM Cantilever
F 190 kHz
C 48 N/m
L 225 µm
*nominal values

Applications

How to optimize AFM scan parameters gear icon

The PointProbe® Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.

NANOSENSORS™ PPP-NCL AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). As an alternative to NANOSENSORS high frequency non contact type (NCH) the NCL type is offered. This type is recommended if the feedback loop of the microscope does not accept high frequencies (400kHz) or if the detection system needs a minimum AFM cantilever length >125µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This sensor type combines high operation stability with outstanding sensitivity and fast scanning ability.

The AFM probe offers unique features:

  • metallic conductivity of the AFM tip
  • high mechanical Q-factor for high sensitivity
  • precise alignment of the AFM cantilever position (within +/-2µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series

This AFM probe features alignment grooves on the back side of the holder chip.

The PtIr5 coating is an approximately 25 nm thick double layer of chromium and platinum iridium5 on both sides of the AFM cantilever. The AFM tip side coating enhances the conductivity of the AFM tip and allows electrical contacts. The detector side coating enhances the reflectivity of the laser beam by a factor of about 2 and prevents light from interfering within the AFM cantilever. The coating process is optimized for stress compensation and wear resistance. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees. Please note: Wear at the tip can occur if operating in contact-, friction- or force modulation mode.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 48 N/m (21 - 98 N/m)*
  • 190 kHz (146 - 236 kHz)*
  • 225 µm (215 - 235 µm)*
  • 38 µm (30 - 45 µm)*
  • 7 µm ( 6 - 8 µm)*
  • * guaranteed range
    Loading
    nanosensors-logo
    nanoworld-logo
    budgetsensors-logo
    mikromasch-logo
    opus-logo
    nanotools-logo