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PPP-NCSTPt

Order Code / Price*

Quantity

PPP-NCSTPt-10 Box of 10 AFM Probes

566 566.00 USD

Volume Discount Available [?]

PPP-NCSTPt-20 Box of 20 AFM Probes

1011 1011.00 USD

Your volume discount is 121.00 USD or 10.70%

PPP-NCSTPt-50 Box of 50 AFM Probes

2230 2230.00 USD

Your volume discount is 600.00 USD or 21.20%

PPP-NCSTPt-W Box of 380 AFM Probes

11932 11932.00 USD

Your volume discount is 9576.00 USD or 44.50%

Product availability: On stock

Front view SEM image of PointProbe® Plus AFM tip

Close-up view SEM image of PointProbe® Plus AFM tip

PPP-NCSTPt

Electrical, Soft Tapping Mode AFM Probe

Manufacturer: NANOSENSORS

Coating: Electrically Conductive
AFM tip shape: Standard

AFM Cantilever

F 160 kHz

C 7.4 N/m

L 150 µm

*nominal values

Applications

Conductive AFM Probes

How to optimize AFM scan parameters

How to use standard AFM Probes on Park AFM Systems

The PointProbe® Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.

NANOSENSORS™ PPP-NCSTPt AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft AFM cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. This feature significantly reduces AFM tip wear and sample wear at the same time.

The AFM probe offers unique features:

metallic conductivity of the AFM tip
high mechanical Q-factor for high sensitivity

Please note: Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode.

This AFM probe features alignment grooves on the back side of the holder chip.

The PtIr5 coating is an approximately 25 nm thick double layer of chromium and platinum iridium5 on both sides of the AFM cantilever. The AFM tip side coating enhances the conductivity of the AFM tip and allows electrical contacts. The detector side coating enhances the reflectivity of the laser beam by a factor of about 2 and prevents light from interfering within the AFM cantilever. The coating process is optimized for stress compensation and wear resistance. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:

Shape: Standard

Radius: < 25 nm

AFM Cantilever:

Shape: Beam

Force Constant: 7.4 N/m (1.2 - 29 N/m)*

Resonance Frequency: 160 kHz (75 - 265 kHz)*

Length: 150 µm (140 - 160 µm)*

Width: 27 µm (19.5 - 34.5 µm)*

Thickness: 2.8 µm ( 1.8 - 3.8 µm)*

* guaranteed range

Interested in learning about how this AFM probe has been used by fellow researchers?

Visit the manufacturer’s website for a list of publications mentioning this AFM probe.