NANOSENSORS™ PPP-NCSTPt AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. This feature significantly reduces tip wear and sample wear at the same time.
The probe offers unique features:
Please note: Wear at the tip can occur if operating in contact-, friction- or force modulation mode.
This product features alignment grooves on the back side of the holder chip.