AFM Probes » PPP-SEIH

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Order Code / Price*
Quantity
PPP-SEIH-10 Box of 10 AFM Probes
320.00 USD
PPP-SEIH-50 Box of 50 AFM Probes
1 265.00 USD
Your volume discount is 335.00 USD or 20.90%
PPP-SEIH-W Box of 380 AFM Probes
6 409.00 USD
Your volume discount is 5 751.00 USD or 47.30%
Product availability: On stock

PPP-SEIH

Special Tapping Mode AFM Probe

Coating: none
Tip shape: Standard
Cantilever:
F 130 kHz
C 15 N/m
L 225 µm
*nominal values

Applications

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

For owners of a Seiko Instruments microscope using the non-contact mode we recommend NANOSENSORSPPP-SEIH AFM probes (Seiko Instruments / high force constant).

The probe offers unique features:

  • excellent tip radius of curvature
  • highly doped silicon to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity

This product features alignment grooves on the back side of the holder chip.

Uncoated

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 15 N/m (5 - 37 N/m)*
  • 130 kHz (96 - 175 kHz)*
  • 225 µm (215 - 235 µm)*
  • 33 µm (25 - 40 µm)*
  • 5 µm (4 - 6 µm)*
  • * typical range
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