AFM Probes » PtSi-CONT

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Order Code / Price*
Quantity
PtSi-CONT-10 Box of 10 AFM Probes
1 481.00 USD
Volume Discount Available [?]
PtSi-CONT-20 Box of 20 AFM Probes
2 650.00 USD
Your volume discount is 312.00 USD or 10.50%
PtSi-CONT-50 Box of 50 AFM Probes
5 846.00 USD
Your volume discount is 1 559.00 USD or 21.10%
Product availability: On stock

PtSi-CONT

Electrical, Contact Mode AFM Probes

Coating: Platinum Silicide Overall
Tip shape: Standard
Cantilever:
F 13 kHz
C 0.2 N/m
L 450 µm
*nominal values

Applications

NANOSENSORS PtSi-CONT are designed for contact mode (repulsive mode) AFM imaging. Furthermore this probe can be used for force-distance spectroscopy or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due a low force constant. For applications that require a wear resistant and electrically conductive tip we recommend this type. NANOSENSORS PtSi-CONT are suitable for C-AFM, Tunneling AFM (TUNA) and Scanning Capacitance Microscopy (SCM).

This probe offers unique features:

  • platinum silicide coating with excellent conductivity and good wear-out behaviour
  • chemically inert
  • high mechanical Q-factor for high sensitivity

This product features alignment grooves on the back side of the holder chip.

Platinum silicide on both sides of the cantilever.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 0.2 N/m (0.02 - 0.77 N/m)*
  • 13 kHz (6 - 21 kHz)*
  • 450 µm (440 - 460 µm)*
  • 50 µm (42.5 - 57.5 µm)*
  • 2 µm (1 - 3 µm)*
  • * typical range
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