AFM Probes » PtSi-CONT

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Order Code / Price*
Quantity
PtSi-CONT-10 Box of 10 AFM Probes
1481.00 USD
PtSi-CONT-20 Box of 20 AFM Probes
2650.00 USD
Your volume discount is 312.00 USD or 10.50%
PtSi-CONT-50 Box of 50 AFM Probes
5846.00 USD
Your volume discount is 1559.00 USD or 21.10%
Product availability: On stock

PtSi-CONT

Electrical, Contact Mode AFM Probes

Manufacturer: NANOSENSORS

Coating: Platinum Silicide Overall
AFM tip shape: Standard
AFM Cantilever
F 13 kHz
C 0.2 N/m
L 450 µm
*nominal values

Applications

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NANOSENSORS PtSi-CONT are designed for contact mode (repulsive mode) AFM imaging. Furthermore this probe can be used for force-distance spectroscopy or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due a low force constant. For applications that require a wear resistant and electrically conductive AFM tip we recommend this type. NANOSENSORS PtSi-CONT are suitable for C-AFM, Tunneling AFM (TUNA) and Scanning Capacitance Microscopy (SCM).

This AFM probe offers unique features:

  • platinum silicide coating with excellent conductivity and good wear-out behaviour
  • chemically inert
  • high mechanical Q-factor for high sensitivity

This product features alignment grooves on the back side of the holder chip.

Platinum silicide on both sides of the AFM cantilever.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 0.2 N/m (0.02 - 0.77 N/m)*
  • 13 kHz (6 - 21 kHz)*
  • 450 µm (440 - 460 µm)*
  • 50 µm (42.5 - 57.5 µm)*
  • 2 µm ( 1 - 3 µm)*
  • * typical range
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