AFM Probes » PtSi-CONT

Order Code / Price*

Quantity

PtSi-CONT-10 Box of 10 AFM Probes

1481 1 481.00 USD

Volume Discount Available [?]

PtSi-CONT-20 Box of 20 AFM Probes

2650 2 650.00 USD

Your volume discount is 312.00 USD or 10.50%

PtSi-CONT-50 Box of 50 AFM Probes

5846 5 846.00 USD

Your volume discount is 1 559.00 USD or 21.10%

Product availability: On stock

SEM image of platinum silicide (PtSi) AFM tip

PtSi-CONT

Electrical, Contact Mode AFM Probes

Manufacturer: NANOSENSORS

Coating: Platinum Silicide Overall
AFM tip shape: Standard

AFM cantilever:

F 13 kHz

C 0.2 N/m

L 450 µm

*nominal values

Applications

NANOSENSORS PtSi-CONT are designed for contact mode (repulsive mode) AFM imaging. Furthermore this probe can be used for force-distance spectroscopy or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due a low force constant. For applications that require a wear resistant and electrically conductive tip we recommend this type. NANOSENSORS PtSi-CONT are suitable for C-AFM, Tunneling AFM (TUNA) and Scanning Capacitance Microscopy (SCM).

This probe offers unique features:

platinum silicide coating with excellent conductivity and good wear-out behaviour
chemically inert
high mechanical Q-factor for high sensitivity

This product features alignment grooves on the back side of the holder chip.

Platinum silicide on both sides of the cantilever.

AFM Tip:

Shape: Standard

Radius: < 25 nm

AFM Cantilever:

Shape: Beam

Force Constant: 0.2 N/m (0.02 - 0.77 N/m)*

Resonance Frequency: 13 kHz (6 - 21 kHz)*

Length: 450 µm (440 - 460 µm)*

Width: 50 µm (42.5 - 57.5 µm)*

Thickness: 2 µm ( 1 - 3 µm)*

* typical range

AFM Probes » PtSi-CONT

PtSi-CONT

Electrical, Contact Mode AFM Probes