NanoWorld Pointprobe® S-MFMR AFM probes are designed for the measurement of magnetic domains in soft magnetic samples. Due to the low coercivity of the soft magnetic AFM tip coating the magnetisation of the AFM tip will easily get reoriented by hard magnetic samples.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. The AFM tip is shaped like a polygon based pyramid.
Additionally, this sensor offers unique features:
This AFM probe features alignment grooves on the back side of the holder chip.