AFM Probes »

SCM-PIC

Order Code / Price*

Quantity

SCM-PIC-10 Box of 10 AFM Probes

457 457.00 USD

Volume Discount Available [?]

SCM-PIC-20 Box of 20 AFM Probes

819 819.00 USD

Your volume discount is 95.00 USD or 10.40%

SCM-PIC-50 Box of 50 AFM Probes

1806 1806.00 USD

Your volume discount is 479.00 USD or 21.00%

SCM-PIC-W Box of 380 AFM Probes

9614 9614.00 USD

Your volume discount is 7752.00 USD or 44.60%

Product availability: On stock

SEM image of PointProbe® Plus AFM tip

SCM-PIC

Name: SCM-PIC-10 Electrical, Contact Mode AFM Probe
Brand: NanoWorld
SKU: SCM-PIC-10
Price: 457 USD
Availability: InStock

Electrical, Contact Mode AFM Probe

Manufacturer: NanoWorld

Coating: Electrically Conductive
AFM tip shape: Standard

AFM Cantilever

F 13 kHz

C 0.2 N/m

L 450 µm

*nominal values

Applications

Conductive AFM Probes

How to optimize AFM scan parameters

NanoWorld Pointprobe® CONT AFM probes are designed for contact mode imaging. Furthermore this AFM probe can be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimised for high sensitivity due to a low force constant.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

This AFM probe was sold by Veeco Instruments Inc. for over 10 years up until April 2007. Bruker Corporation, which acquired Veeco metrology business, is no longer selling the original AFM probe which has always been manufactured by NanoWorld®.

This AFM probe features alignment grooves on the back side of the holder chip.

PtIr5 Coating

The PtIr5 coating consists of a 23 nm thick platinum iridium5 layer deposited on both sides of the AFM cantilever. The tip side coating enhances the conductivity of the AFM tip and allows electrical contacts. The detector side coating enhances the reflectance of the laser beam by a factor of 2 and prevents light from interfering within the AFM cantilever.

The coating process is optimized for stress compensation and wear resistance. Wear at AFM the tip can occur if operating in contact-, friction- or force modulation mode. As the coating is almost stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:

Shape: Standard

Radius: < 25 nm

AFM Cantilever:

Shape: Beam

Force Constant: 0.2 N/m (0.07 - 0.4 N/m)*

Resonance Frequency: 13 kHz (9 - 17 kHz)*

Length: 450 µm (445 - 455 µm)*

Width: 50 µm (45 - 55 µm)*

Thickness: 2 µm ( 1.5 - 2.5 µm)*

* typical range