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SCM-PIT

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Order Code / Price*
Quantity
SCM-PIT-10 Box of 10 AFM Probes
457.00 USD
SCM-PIT-50 Box of 50 AFM Probes
1806.00 USD
Your volume discount is 479.00 USD or 21.00%
SCM-PIT-W Box of 380 AFM Probes
9614.00 USD
Your volume discount is 7752.00 USD or 44.60%
Product availability: On stock

SCM-PIT

Electrical, Force Modulation AFM Probe

Manufacturer: NanoWorld

Coating: Electrically Conductive
AFM tip shape: Standard
AFM Cantilever
F 75 kHz
C 2.8 N/m
L 225 µm
*nominal values

Applications

How to optimize AFM scan parameters gear icon
NanoWorld Pointprobe® EFM probes are designed for electrostatic force microscopy. The force constant and the special coating of the EFM type are optimised for this type of application. This type of AFM probe yields a very high force sensitivity, while simultaneously enabling tapping™ and lift mode operation.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

This AFM probe was sold by Veeco Instruments Inc. for over 10 years up until April 2007. Bruker Corporation, which acquired Veeco metrology business, is no longer selling the original AFM probe which has always been manufactured by NanoWorld®.

This AFM probe features alignment grooves on the back side of the holder chip.

PtIr5 Coating

The PtIr5 coating consists of a 23 nm thick platinum iridium5 layer deposited on both sides of the AFM cantilever. The tip side coating enhances the conductivity of the AFM tip and allows electrical contacts. The detector side coating enhances the reflectance of the laser beam by a factor of 2 and prevents light from interfering within the AFM cantilever.

The coating process is optimized for stress compensation and wear resistance. Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode. As the coating is almost stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 2.8 N/m (1.2 - 5.5 N/m)*
  • 75 kHz (60 - 90 kHz)*
  • 225 µm (220 - 230 µm)*
  • 28 µm (22.5 - 32.5 µm)*
  • 3 µm ( 2.5 - 3.5 µm)*
  • * typical range
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