The NANOSENSORS™ SSS-QMFMR AFM probe combines the high resolution performance of the SuperSharpSilicon™ magnetic force microscopy probe with the high mechanical quality factor under ultra high vacuum conditions of the Q30K-Plus-Series. An extremely small radius of the coated AFM tip, a high aspect ratio at the last few hundred nanometers of the AFM tip and a Q-factor of more than 35,000 facilitates outstanding lateral resolution in the magnetic force image and high operation stability under UHV conditions.
Due to the low magnetic moment of the AFM tip the sensitivity to magnetic forces is decreased if compared to standard MFM AFM probe but the disturbance of soft magnetic samples is also reduced.
The SPM probe offers unique features:
As both coatings are almost stress-free the bending of the AFM cantilever due to stress is less than 3.5% of the AFM cantilever length. For enhanced signal strength the magnetization of the AFM tip by means of a strong permanent magnet prior to the measurement is recommended.
This product features alignment grooves on the back side of the holder chip.