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SSS-SEIH

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Order Code / Price*
Quantity
SSS-SEIH-10 Box of 10 AFM Probes
900.00 USD
SSS-SEIH-50 Box of 50 AFM Probes
3550.00 USD
Your volume discount is 950.00 USD or 21.10%
Product availability: On stock

SSS-SEIH

SuperSharp, Special Tapping Mode AFM Probe

Manufacturer: NANOSENSORS

Coating: none
AFM tip shape: Supersharp
AFM Cantilever
F 130 kHz
C 15 N/m
L 225 µm
*nominal values

Applications

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For owners of a Seiko Instruments microscope using the non-contact mode we recommend the NANOSENSORS™ SEIH type (Seiko Instruments / high force constant). Compared with the ZEIH type the force constant is further reduced.

For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ AFM tip with unrivalled sharpness.

The AFM probe offers unique features:

  • excellent AFM tip radius of curvature
  • typical aspect ratio at 200 nm from AFM tip apex in the order of 3:1
  • monolithic material
  • highly doped silicon to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity
  • precise alignment of the AFM cantilever position (within +/- 2 µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series

This AFM probe features alignment grooves on the back side of the holder chip.

Uncoated

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 15 N/m (5 - 37 N/m)*
  • 130 kHz (96 - 175 kHz)*
  • 225 µm (215 - 235 µm)*
  • 33 µm (30 - 45 µm)*
  • 5 µm ( 4 - 6 µm)*
  • * guaranteed range
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