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TESP

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Order Code / Price*
Quantity
TESP-10 Box of 10 AFM Probes
335.00 USD
TESP-50 Box of 50 AFM Probes
1324.00 USD
Your volume discount is 351.00 USD or 21.00%
TESP-W Box of 380 AFM Probes
7050.00 USD
Your volume discount is 5680.00 USD or 44.60%
Product availability: On stock

TESP

Standard Tapping Mode AFM Probe

Manufacturer: NanoWorld

Coating: none
AFM tip shape: Standard
AFM Cantilever
F 320 kHz
C 42 N/m
L 125 µm
*nominal values

Applications

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NanoWorld Pointprobe® NCH AFM probes are designed for non-contact or tapping™ mode imaging. This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.
 
This AFM probe was sold by Veeco Instruments Inc. for over 10 years up until April 2007. Bruker Corporation, which acquired Veeco metrology business, is no longer selling the original AFM probe which has always been manufactured by NanoWorld®.

This AFM probe features alignment grooves on the back side of the holder chip.

Uncoated

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 42 N/m (21 - 78 N/m)*
  • 320 kHz (250 - 390 kHz)*
  • 125 µm (120 - 130 µm)*
  • 30 µm (25 - 35 µm)*
  • 4 µm ( 3.5 - 4.5 µm)*
  • * typical range
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