AFM Probes » TESP

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Order Code / Price*
Quantity
TESP-10 Box of 10 AFM Probes
279.00 USD
TESP-50 Box of 50 AFM Probes
1 104.00 USD
Your volume discount is 291.00 USD or 20.90%
TESP-W Box of 380 AFM Probes
5 672.00 USD
Your volume discount is 4 930.00 USD or 46.50%
Product availability: On stock

TESP

Standard Tapping Mode AFM Probe

Coating: none
Tip shape: Standard
Cantilever:
F 320 kHz
C 42 N/m
L 125 µm
*nominal values

Applications

NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.
 
This probe was sold by Veeco Instruments Inc. for over 10 years up until April 2007. Bruker Corporation, which acquired Veeco metrology business, is no longer selling the original probe which has always been manufactured by NanoWorld®.

This product features alignment grooves on the back side of the holder chip.

Uncoated

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 42 N/m (21 - 78 N/m)*
  • 320 kHz (250 - 390 kHz)*
  • 125 µm (120 - 130 µm)*
  • 30 µm (25 - 35 µm)*
  • 4 µm (3.5 - 4.5 µm)*
  • * typical range
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