AFM Probes » TESP-SS

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Order Code / Price*
Quantity
TESP-SS-10 Box of 10 AFM Probes
743.00 USD
TESP-SS-50 Box of 50 AFM Probes
2900.00 USD
Your volume discount is 815.00 USD or 21.90%
TESP-SS-380 Box of 380 AFM Probes
14695.00 USD
Your volume discount is 13539.00 USD or 48.00%
Product availability: On stock

TESP-SS

SuperSharp, Tapping Mode AFM Probe

Manufacturer: NanoWorld

Coating: none
AFM tip shape: Supersharp
AFM Cantilever
F 320 kHz
C 42 N/m
L 125 µm
*nominal values

Applications

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NanoWorld Pointprobe® NCH AFM probes are designed for non-contact or tapping™ mode imaging. This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

For enhanced resolution of nanostructures and microroughness we have developed an advanced AFM tip manufacturing process leading to unrivalled sharpness of the SuperSharpSilicon tip.

This AFM probe offers unique features:

  • excellent tip radius of curvature
  • guaranteed tip radius of curvature 5 nm (yield >80%)

 
This AFM probe was sold by Veeco Instruments Inc. for over 10 years up until April 2007. Bruker Corporation, which acquired Veeco metrology business, is no longer selling the original AFM probe which has always been manufactured by NanoWorld®.

This product features alignment grooves on the back side of the holder chip.

Uncoated

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 42 N/m (21 - 78 N/m)*
  • 320 kHz (250 - 390 kHz)*
  • 125 µm (120 - 130 µm)*
  • 30 µm (25 - 35 µm)*
  • 4 µm ( 3.5 - 4.5 µm)*
  • * typical range
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