AFM probes are designed for special applications where no AFM tip at the AFM cantilever is needed.
The AFM probe offers unique features:
- no AFM tip
- highly doped silicon to dissipate static charge
- chemically inert
- high mechanical Q-factor for high sensitivity
- precise alignment of the AFM cantilever position (within +/- 2 µm) when used with the Alignment Chip
- compatible with PointProbe® Plus XY-Alignment Series