NanoWorld Pointprobe® ZEIHR AFM probes are designed for owners of the Zeiss Veritekt microscope using the step mode (non-contact mode). Compared to the Pointprobe® non-contact AFM probes of the NCH and NCL type the force constant is reduced and the resonance frequency is lower.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.
Additionally, this AFM probe offers an excellent tip radius of curvature.
This AFM probe features alignment grooves on the back side of the holder chip.