AFM Probes » HQ:CSC37/tipless/Cr-Au

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HQ:CSC37/tipless/Cr-Au-15 Box of 15 AFM Probes
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HQ:CSC37/tipless/Cr-Au-50 Box of 50 AFM Probes
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HQ:CSC37/tipless/Cr-Au-100 Box of 100 AFM Probes
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HQ:CSC37/tipless/Cr-Au

Tipless AFM Probe with 3 Different Gold Coated Contact Mode AFM Cantilevers

Manufacturer: MikroMasch

Coating: Gold Overall
AFM tip shape: Tipless
This probe features 3 cantilevers
F 40 kHz
C 0.8 N/m
L 250 µm
F 20 kHz
C 0.3 N/m
L 350 µm
F 30 kHz
C 0.4 N/m
L 300 µm
*nominal values

Applications

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AFM probes of the 37/tipless series have three different tipless contact mode AFM cantilevers on one side of the holder chip. They can be used in various applications.

AFM probes with overall conductive chemically inert 30 nm Au coating with 20 nm Cr sublayer on both sides of the AFM cantilever. The coating may cause AFM cantilever bending within 3°.

Cr-Au coating is formed as a 30 nm Au film with a 20 nm Cr sublayer, which is deposited for better adhesion of Au. The coating is formed on both sides of the AFM cantilever.

AFM Tip:


  • 3 AFM Cantilevers:

    Cantilever A
  • Beam
  • 0.8 N/m (0.3 - 2 N/m)*
  • 40 kHz (30 - 55 kHz)*
  • 250 µm (245 - 255 µm)*
  • 35 µm (32 - 38 µm)*
  • 2 µm ( 1.5 - 2.5 µm)*
  • Cantilever B
  • Beam
  • 0.3 N/m (0.1 - 0.6 N/m)*
  • 20 kHz (15 - 30 kHz)*
  • 350 µm (345 - 355 µm)*
  • 35 µm (32 - 38 µm)*
  • 2 µm ( 1.5 - 2.5 µm)*
  • Cantilever C
  • Beam
  • 0.4 N/m (0.1 - 1 N/m)*
  • 30 kHz (20 - 40 kHz)*
  • 300 µm (295 - 305 µm)*
  • 35 µm (32 - 38 µm)*
  • 2 µm ( 1.5 - 2.5 µm)*
  • * typical range
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